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Information card for entry 4000878
Preview
Coordinates | 4000878.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C50 H76 S8 |
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Calculated formula | C50 H76 S8 |
SMILES | CCCCCCCCCCCCCCCCc1c(sc2c1sc(c2CCCCCCCCCCCCCCCC)c1scc2c1SCCS2)c1scc2c1SCCS2 |
Title of publication | Synthesis and Electropolymerization of Hexadecyl Functionalized Bithiophene and Thieno[3,2-b]thiophene End-Capped with EDOT and EDTT Units |
Authors of publication | McEntee, Greg J.; Skabara, Peter J.; Vilela, Filipe; Tierney, Steven; Samuel, Ifor D. W.; Gambino, Salvatore; Coles, Simon J.; Hursthouse, Michael B.; Harrington, Ross W.; Clegg, William |
Journal of publication | Chemistry of Materials |
Year of publication | 2010 |
Journal volume | 22 |
Journal issue | 9 |
Pages of publication | 3000 |
a | 7.1255 ± 0.0001 Å |
b | 11.4922 ± 0.0002 Å |
c | 16.5104 ± 0.0003 Å |
α | 71.958 ± 0.001° |
β | 83.543 ± 0.001° |
γ | 82.168 ± 0.001° |
Cell volume | 1269.98 ± 0.04 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0542 |
Residual factor for significantly intense reflections | 0.0431 |
Weighted residual factors for significantly intense reflections | 0.0868 |
Weighted residual factors for all reflections included in the refinement | 0.0932 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4000878.html
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Users of the data should acknowledge the original authors of the
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