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Information card for entry 4064905
Preview
Coordinates | 4064905.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H44 N2 Si Zr |
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Calculated formula | C44 H44 N2 Si Zr |
SMILES | [Zr]123456789(N=C=C(c%10ccccc%10)c%10ccccc%10)([NH]=C(C(=C9[Si](C)(C)C)C)C(c9ccccc9)c9ccccc9)([cH]9[cH]1[cH]2[cH]3[cH]49)[cH]1[cH]8[cH]7[cH]6[cH]51 |
Title of publication | Formation of Zirconocenes Containing Vinyl-imine and Keteniminate Species from Zirconacycles and Diphenylacetonitrile |
Authors of publication | Zhao, Jing; Zhang, Shaoguang; Zhang, Wen-Xiong; Xi, Zhenfeng |
Journal of publication | Organometallics |
Year of publication | 2011 |
Journal volume | 30 |
Journal issue | 13 |
Pages of publication | 3464 |
a | 13.56 ± 0.004 Å |
b | 18.179 ± 0.005 Å |
c | 17.708 ± 0.005 Å |
α | 90° |
β | 122.93 ± 0.004° |
γ | 90° |
Cell volume | 3663.8 ± 1.8 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0879 |
Residual factor for significantly intense reflections | 0.0754 |
Weighted residual factors for significantly intense reflections | 0.144 |
Weighted residual factors for all reflections included in the refinement | 0.1511 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.183 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4064905.html
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