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Information card for entry 4118632
Preview
Coordinates | 4118632.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H84 Co N3 O Si6 U |
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Calculated formula | C38 H84 Co N3 O Si6 U |
SMILES | [U](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)=O.[Co]12345678([c]9([c]3([c]2([c]1([c]69C)C)C)C)C)[c]1([c]7([c]4([c]5(C)[c]81C)C)C)C |
Title of publication | A Complete Family of Terminal Uranium Chalcogenides, [U(E)(N{SiMe3}2)3]- (E = O, S, Se, Te) |
Authors of publication | Jessie L. Brown; Skye Fortier; Richard A. Lewis; Guang Wu; Trevor W. Hayton |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2012 |
Journal volume | 134 |
Pages of publication | 15468 - 15475 |
a | 19.8951 ± 0.0015 Å |
b | 14.027 ± 0.001 Å |
c | 20.5125 ± 0.0013 Å |
α | 90° |
β | 115.802 ± 0.004° |
γ | 90° |
Cell volume | 5153.7 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.072 |
Residual factor for significantly intense reflections | 0.0461 |
Weighted residual factors for significantly intense reflections | 0.0917 |
Weighted residual factors for all reflections included in the refinement | 0.0986 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4118632.html
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Users of the data should acknowledge the original authors of the
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