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Information card for entry 4127551
Preview
Coordinates | 4127551.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H79 B Co N2 O P3 Si |
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Calculated formula | C44 H79 B Co N2 O P3 Si |
SMILES | [CoH2]12([P](C(C)C)(C(C)C)C[B](c3ccccc3)(C[P]1(C(C)C)C(C)C)C[P]2(C(C)C)C(C)C)[SiH]([n+]1ccc(N(C)C)cc1)c1ccccc1.O1CCCC1 |
Title of publication | Activations of all Bonds to Silicon (Si-H, Si-C) in a Silane with Extrusion of [CoSiCo] Silicide Cores. |
Authors of publication | Handford, Rex C.; Smith, Patrick W.; Tilley, T. Don |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 22 |
Pages of publication | 8769 - 8772 |
a | 21.403 ± 0.001 Å |
b | 10.1831 ± 0.0005 Å |
c | 21.2625 ± 0.001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4634.1 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100.15 K |
Number of distinct elements | 8 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0327 |
Residual factor for significantly intense reflections | 0.0289 |
Weighted residual factors for significantly intense reflections | 0.0709 |
Weighted residual factors for all reflections included in the refinement | 0.0797 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.119 |
Diffraction radiation wavelength | 0.7288 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4127551.html
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