Information card for entry 4317728

Structure parameters

• Formula: C6 H18 N4 S2 Se Si2
• Calculated formula: C6 H18 N4 S2 Se Si2
• SMILES: [Se](N=S=N[Si](C)(C)C)N=S=N[Si](C)(C)C
• Title of publication: Preparation and Structural Characterization of (Me3SiNSN)2Se, a New Synthon for Sulfur-Selenium Nitrides
• Authors of publication: Jari Konu; Arto Maaninen; Katja Paananen; Petri Ingman; Risto S. Laitinen; Tristram Chivers; Jussi Valkonen
• Journal of publication: Inorganic Chemistry
• Year of publication: 2002
• Journal volume: 41
• Pages of publication: 1430 - 1435
• a: 7.2362 ± 0.0014 Å
• b: 19.26 ± 0.004 Å
• c: 11.436 ± 0.002 Å
• α: 90°
• β: 92.05 ± 0.03°
• γ: 90°
• Cell volume: 1592.8 ± 0.5 ų
• Cell temperature: 118 ± 2 K
• Ambient diffraction temperature: 118 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0488
• Residual factor for significantly intense reflections: 0.0354
• Weighted residual factors for significantly intense reflections: 0.0748
• Weighted residual factors for all reflections included in the refinement: 0.0799
• Goodness-of-fit parameter for all reflections included in the refinement: 1.046
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No