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Information card for entry 4503233
Preview
Coordinates | 4503233.cif |
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Original paper (by DOI) | HTML |
Formula | C17 H27 N O2 |
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Calculated formula | C17 H27 N O2 |
SMILES | O(c1ccc(cc1)[C@@H](C1(O)CCCCC1)CN(C)C)C |
Title of publication | Polymorphism and Migratory Chiral Resolution of the Free Base of Venlafaxine. A Remarkable Topotactical Solid State Transition from a Racemate to a Racemic Conglomerate |
Authors of publication | van Eupen, J. Th. H.; Elffrink, W. W. J.; Keltjens, R.; Bennema, P.; de Gelder, R.; Smits, J. M. M.; van Eck, E. R. H.; Kentgens, A. P. M.; Deij, M. A.; Meekes, H.; Vlieg, E. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2008 |
Journal volume | 8 |
Journal issue | 1 |
Pages of publication | 71 |
a | 8.1461 ± 0.001 Å |
b | 8.803 ± 0.0006 Å |
c | 22.3022 ± 0.0019 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1599.3 ± 0.3 Å3 |
Cell temperature | 208 ± 2 K |
Ambient diffraction temperature | 208 ± 2 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.1255 |
Residual factor for significantly intense reflections | 0.0682 |
Weighted residual factors for all reflections | 0.1377 |
Weighted residual factors for significantly intense reflections | 0.1196 |
Weighted residual factors for all reflections included in the refinement | 0.1377 |
Goodness-of-fit parameter for all reflections | 1.108 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.108 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4503233.html
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Users of the data should acknowledge the original authors of the
structural data.