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#$Date: 2016-02-13 20:28:24 +0100 (Sat 13 de Feb de 2016) $
#$Revision: 176429 $
#$URL: svn://www.crystallography.net/cod/cif/1/53/62/1536253.cif $
#------------------------------------------------------------------------------
#
# This file is available in the Crystallography Open Database (COD),
# http://www.crystallography.net/
#
# All data on this site have been placed in the public domain by the
# contributors.
#
data_1536253
loop_
_publ_author_name
'Dahn, J.R.'
'Way, B.M.'
'Tse, J.S.'
'Fuller, E.'
_publ_section_title
;
 Structures of siloxene and layered polysilane (Si6 H6)
;
_journal_name_full
'Physical Review, Serie 3. B - Condensed Matter (18,1978-)'
_journal_page_first              17872
_journal_page_last               17877
_journal_volume                  48
_journal_year                    1993
_chemical_formula_sum            'H2 O Si2'
_chemical_name_systematic        'Si2 H2 O'
_space_group_IT_number           143
_symmetry_space_group_name_Hall  'P 3'
_symmetry_space_group_name_H-M   'P 3'
_cell_angle_alpha                90
_cell_angle_beta                 90
_cell_angle_gamma                120
_cell_formula_units_Z            1
_cell_length_a                   3.83
_cell_length_b                   3.83
_cell_length_c                   5.9
_cell_volume                     74.951
_citation_journal_id_ASTM        PRBMDO
_cod_data_source_file            Dahn_PRBMDO_1993_1884.cif
_cod_data_source_block           H2O1Si2
_cod_original_cell_volume        74.95148
_cod_original_formula_sum        'H2 O1 Si2'
_cod_database_code               1536253
loop_
_symmetry_equiv_pos_as_xyz
x,y,z
-y,x-y,z
-x+y,-x,z
loop_
_atom_site_label
_atom_site_type_symbol
_atom_site_fract_x
_atom_site_fract_y
_atom_site_fract_z
_atom_site_occupancy
_atom_site_U_iso_or_equiv
Si2 Si 0.6667 0.3333 -0.069 1 0.0
O1 O 0.3333 0.6667 0.34 1 0.0
Si1 Si 0.3333 0.6667 0.069 1 0.0
