Information card for entry 1571461
| Formula |
C28 H24 O2 S2 |
| Calculated formula |
C28 H24 O2 S2 |
| Title of publication |
Benchmarking break-junction techniques: Electric and thermoelectric characterization of naphthalenophanes |
| Authors of publication |
Hurtado-Gallego, Juan; van der Poel, Sebastian; Blaschke, Matthias; Gallego, Almudena; Hsu, Chun-Wei; López-Nebreda, Rubén; Mayor, Marcel; Pauly, Fabian; Agrait, Nicolas; van der Zant, Herre S.J. |
| Journal of publication |
Nanoscale |
| Year of publication |
2024 |
| a |
10.9064 ± 0.0005 Å |
| b |
18.3923 ± 0.0011 Å |
| c |
10.9552 ± 0.0005 Å |
| α |
90° |
| β |
90.901 ± 0.004° |
| γ |
90° |
| Cell volume |
2197.27 ± 0.19 Å3 |
| Cell temperature |
150 K |
| Ambient diffraction temperature |
150 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1056 |
| Residual factor for significantly intense reflections |
0.0813 |
| Weighted residual factors for significantly intense reflections |
0.2333 |
| Weighted residual factors for all reflections included in the refinement |
0.2574 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.03 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.34143 Å |
| Diffraction radiation type |
GaKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/1571461.html
