Crystallography Open Database

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Searching journal of publication like 'Acta Crystallographica, Section B: Structural Science' volume of publication is 55

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2105641 CIF
Paper
C4 H16 Cl4 Co N2P 1 21/n 18.564; 11.4573; 13.359
90; 90.037; 90
1310.79Mahmoudkhani, Amir H.; Langer, Vratislav
Structure of [(CH~3~)~2~NH~2~]~2~CoCl~4~ at elevated temperatures
Acta Crystallographica Section B, 1999, 55, 752-757
2105642 CIF
Paper
C4 H16 Cl4 Co N2P 1 21/n 18.5775; 11.4679; 13.3855
90; 90.021; 90
1316.68Mahmoudkhani, Amir H.; Langer, Vratislav
Structure of [(CH~3~)~2~NH~2~]~2~CoCl~4~ at elevated temperatures
Acta Crystallographica Section B, 1999, 55, 752-757
2105643 CIF
Paper
As O5 Rb TiP n a 2113.218; 6.65; 10.761
90; 90; 90
945.89Almgren, Jenni; Streltsov, Victor A.; Sobolev, Alexander N.; Figgis, Brian N.; Albertsson, Jörgen
Structure of and electron density in RbTiOAsO~4~ at 9.6K
Acta Crystallographica Section B, 1999, 55, 712-720
2105644 CIF
Paper
As O5 Rb TiP n a 2113.261; 6.6791; 10.769
90; 90; 90
953.8Almgren, Jenni; Streltsov, Victor A.; Sobolev, Alexander N.; Figgis, Brian N.; Albertsson, Jörgen
Structure of and electron density in RbTiOAsO~4~ at 9.6K
Acta Crystallographica Section B, 1999, 55, 712-720
2105645 CIF
Paper
C5 H10 N2 O4P 21 21 217.275; 9.097; 10.507
90; 90; 90
695.4Görbitz, Carl Henrik
What is the best crystal size for collection of X-ray data? Refinement of the structure of glycyl-<small>L</small>-serine based on data from a very large crystal
Acta Crystallographica Section B, 1999, 55, 1090-1098
2105646 CIF
Paper
C5 H10 N2 O4P 21 21 217.275; 9.097; 10.507
90; 90; 90
695.4Görbitz, Carl Henrik
What is the best crystal size for collection of X-ray data? Refinement of the structure of glycyl-<small>L</small>-serine based on data from a very large crystal
Acta Crystallographica Section B, 1999, 55, 1090-1098
2105647 CIF
Paper
C5 H10 N2 O4P 21 21 217.275; 9.097; 10.507
90; 90; 90
695.4Görbitz, Carl Henrik
What is the best crystal size for collection of X-ray data? Refinement of the structure of glycyl-<small>L</small>-serine based on data from a very large crystal
Acta Crystallographica Section B, 1999, 55, 1090-1098
2105648 CIF
Paper
C5 H10 N2 O4P 21 21 217.275; 9.097; 10.507
90; 90; 90
695.4Görbitz, Carl Henrik
What is the best crystal size for collection of X-ray data? Refinement of the structure of glycyl-<small>L</small>-serine based on data from a very large crystal
Acta Crystallographica Section B, 1999, 55, 1090-1098
2105649 CIF
Paper
C5 H10 N2 O4P 21 21 217.275; 9.097; 10.507
90; 90; 90
695.4Görbitz, Carl Henrik
What is the best crystal size for collection of X-ray data? Refinement of the structure of glycyl-<small>L</small>-serine based on data from a very large crystal
Acta Crystallographica Section B, 1999, 55, 1090-1098
2105650 CIF
Paper
C5 H10 N2 O4P 21 21 217.275; 9.097; 10.507
90; 90; 90
695.4Görbitz, Carl Henrik
What is the best crystal size for collection of X-ray data? Refinement of the structure of glycyl-<small>L</small>-serine based on data from a very large crystal
Acta Crystallographica Section B, 1999, 55, 1090-1098
2105651 CIF
Paper
C5 H10 N2 O4P 21 21 217.275; 9.097; 10.507
90; 90; 90
695.4Görbitz, Carl Henrik
What is the best crystal size for collection of X-ray data? Refinement of the structure of glycyl-<small>L</small>-serine based on data from a very large crystal
Acta Crystallographica Section B, 1999, 55, 1090-1098
2105669 CIF
Paper
Eu0.976 Mo7.1 O14 V1.13Cmca(00\g)s0011.306; 10.025; 9.254
90; 90; 90
1048.87Leligny, H.; Grebille, D.; Roussel, P.; Labbé, Ph.; Hervieu, M.; Raveau, B.; Tortelier, J.; Gougeon, P.
Cluster configurations in modulated EuV~<i>x~</i>Mo~8{±~<i>y</i>}O~14~ crystals
Acta Crystallographica Section B, 1999, 55, 467-483
2105670 CIF
Paper
Eu0.986 Mo7.3 O14 V1.1Cmca(00\g)s0011.325; 10.024; 9.24
90; 90; 90
1048.94Leligny, H.; Grebille, D.; Roussel, P.; Labbé, Ph.; Hervieu, M.; Raveau, B.; Tortelier, J.; Gougeon, P.
Cluster configurations in modulated EuV~<i>x~</i>Mo~8{±~<i>y</i>}O~14~ crystals
Acta Crystallographica Section B, 1999, 55, 467-483
2105671 CIF
Paper
Eu Mo7.96 O14Cmca(00\g)s0011.315; 10.035; 9.265
90; 90; 90
1052Leligny, H.; Grebille, D.; Roussel, P.; Labbé, Ph.; Hervieu, M.; Raveau, B.; Tortelier, J.; Gougeon, P.
Cluster configurations in modulated EuV~<i>x~</i>Mo~8{±~<i>y</i>}O~14~ crystals
Acta Crystallographica Section B, 1999, 55, 467-483
2105672 CIF
Paper
Cu8 Ge S6P m n 219.9073; 9.9073; 9.8703
90; 90; 90.642
968.75Onoda, Mitsuko; Chen, Xue-An; Kato, Katsuo; Sato, Akira; Wada, Hiroaki
Structure refinement of Cu~8~GeS~6~ using X-ray diffraction data from a multiple-twinned crystal
Acta Crystallographica Section B, 1999, 55, 721-725
2105673 CIF
Paper
Cl4 Cs2 HgP n m a9.789; 7.541; 13.418
90; 90; 90
990.5Bagautdinov, Bagautdin; Pilz, Katrin; Ludecke, Jens; van Smaalen, Sander
Modulated structures of Cs~2~HgCl~4~: the 5<i>a</i> superstructure at 185 K and the 3<i>c</i> superstructure at 176 K
Acta Crystallographica Section B, 1999, 55, 886-895
2105674 CIF
Paper
Cl4 Cs2 HgP n m a9.7729; 7.5276; 13.3727
90; 90; 90
983.78Bagautdinov, Bagautdin; Pilz, Katrin; Ludecke, Jens; van Smaalen, Sander
Modulated structures of Cs~2~HgCl~4~: the 5<i>a</i> superstructure at 185 K and the 3<i>c</i> superstructure at 176 K
Acta Crystallographica Section B, 1999, 55, 886-895
2105675 CIF
HKL
Paper
C10 H10 O2P 1 21/c 18.006; 5.482; 19.444
90; 110.46; 90
799.5Herbstein, Frank H.; Iversen, Bo Brummerstedt; Kapon, Moshe; Larsen, Finn Krebs; Madsen, Georg Kent Hellerup; Reisner, George M.
X-ray and neutron diffraction study of benzoylacetone in the temperature range 8–300 K: comparison with other <i>cis</i>-enol molecules
Acta Crystallographica Section B, 1999, 55, 767-787
2105676 CIF
HKL
Paper
C10 H10 O2P 1 21/c 18.027; 5.483; 19.478
90; 110.42; 90
803.4Herbstein, Frank H.; Iversen, Bo Brummerstedt; Kapon, Moshe; Larsen, Finn Krebs; Madsen, Georg Kent Hellerup; Reisner, George M.
X-ray and neutron diffraction study of benzoylacetone in the temperature range 8–300 K: comparison with other <i>cis</i>-enol molecules
Acta Crystallographica Section B, 1999, 55, 767-787
2105677 CIF
Paper
C2 H2 Cl Li O2P 1 21/c 19.3882; 4.8452; 9.0119
90; 94.33; 90
408.76Ehrenberg, H.; Hasse, B.; Schwarz, K.; Epple, M.
Structure determination of lithium chloroacetate, lithium bromoacetate and lithium iodoacetate by powder diffraction
Acta Crystallographica Section B, 1999, 55, 517-524
2105678 CIF
Paper
C2 H2 Br Li O2P 1 21/c 19.7165; 4.861; 9.0228
90; 93.946; 90
425.15Ehrenberg, H.; Hasse, B.; Schwarz, K.; Epple, M.
Structure determination of lithium chloroacetate, lithium bromoacetate and lithium iodoacetate by powder diffraction
Acta Crystallographica Section B, 1999, 55, 517-524
2105679 CIF
Paper
C2 H2 I Li O2P 1 21/c 110.1812; 4.8922; 9.0468
90; 93.251; 90
449.88Ehrenberg, H.; Hasse, B.; Schwarz, K.; Epple, M.
Structure determination of lithium chloroacetate, lithium bromoacetate and lithium iodoacetate by powder diffraction
Acta Crystallographica Section B, 1999, 55, 517-524
2105681 CIF
Paper
O1.879 Y0.242 Zr0.758F m -3 m5.15463; 5.15463; 5.15463
90; 90; 90
136.96Ishizawa, N.; Matsushima, Y.; Hayashi, M.; Ueki, M.
Synchrotron radiation study of yttria-stabilized zirconia, Zr~0.758~Y~0.242~O~1.879~
Acta Crystallographica Section B, 1999, 55, 726-735
2105682 CIF
Paper
O1.879 Y0.242 Zr0.758F m -3 m5.15463; 5.15463; 5.15463
90; 90; 90
136.96Ishizawa, N.; Matsushima, Y.; Hayashi, M.; Ueki, M.
Synchrotron radiation study of yttria-stabilized zirconia, Zr~0.758~Y~0.242~O~1.879~
Acta Crystallographica Section B, 1999, 55, 726-735
2107334 CIFO1.7096 Y0.242 Zr0.7576F m -3 m5.15463; 5.15463; 5.15463
90; 90; 90
136.96Ishizawa, N.; Hayashi, M.; Matsushima, Y.; Ueki, M.
Synchrotron radiation study of yttria-stabilized zirconia, Zr0.758 Y0.242 O1.879
Acta Crystallographica B (39,1983-), 1999, 55, 726-735
2107359 CIFK2.35 Nb5 O15 Pb3.65C m 2 m17.779; 18.015; 3.9209
90; 90; 90
1255.82Sciau, P.; Calvarin, G.; Ravez, J.
Structures des phases paraelectriques et ferroelectriques de Pb2 K Nb5 O15
Acta Crystallographica B (39,1983-), 1999, 55, 459-466
2107401 CIFCu8 Ge S6P m n 217.0445; 6.9661; 9.8699
90; 90; 90
484.343Onoda, M.; Sato, A.; Chen, X.-A.; Wada, H.; Kato, K.
Structure refinement of Cu8 GeS 6 using x-ray diffraction data from a multiple-twinned crystal
Acta Crystallographica B (39,1983-), 1999, 55, 721-725
6000193 CIF
Paper
C13 H36 Si4F m -3 m12.8902; 12.8902; 12.8902
90; 90; 90
2141.8Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000194 CIF
Paper
C12 H36 Si5F m -3 m13.5218; 13.5218; 13.5218
90; 90; 90
2472.31Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000195 CIF
Paper
C12 H36 Si5P 21 313.17158; 13.17158; 13.17158
90; 90; 90
2285.14Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000196 CIF
Paper
C13 H36 Si4P 21 312.609; 12.609; 12.609
90; 90; 90
2004.7Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000197 CIF
Paper
C13 H36 Si4P a -312.7876; 12.7876; 12.7876
90; 90; 90
2091.06Dinnebier, Robert E.; Dollase, Wayne A.; Helluy, Xavier; Kümmerlen, Jörg; Sebald, Angelika; Schmidt, Martin U.; Pagola, Silvina; Stephens, Peter W.; van Smaalen, Sander
Order‒disorder phenomena determined by high-resolution powder diffraction: the structures of tetrakis(trimethylsilyl)methane C[Si(CH~3~)~3~]~4~ and tetrakis(trimethylsilyl)silane Si[Si(CH~3~)~3~]~4~
Acta Crystallographica Section B, 1999, 55, 1014-1029
6000198 CIF
Paper
C15 H25 N O2 SP 1 21/c 116.96; 8.1382; 11.781
90; 104.777; 90
1572.28Tremayne, Maryjane; MacLean, Elizabeth J.; Tang, Chiu C.; Glidewell, Christopher
2,4,6-Triisopropylbenzenesulfonamide: Monte Carlo structure solution from X-ray powder diffraction data for a molecular system containing four independent asymmetric rotors
Acta Crystallographica Section B, 1999, 55, 1068-1074

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