Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 47

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2300452 CIF
Paper
C12 H18 N2 O3 SP 1 c 19.16849; 17.181; 18.1517
90; 96.6067; 90
2840.3Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300453 CIF
HKL
Paper
C12 H18 N2 O3 SP 1 21/n 111.80943; 9.06147; 13.99082
90; 104.584; 90
1448.93Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300454 CIF
HKL
Paper
C2 H5 N O2P 1 21/c 15.10422; 11.97177; 5.93652
90; 121.264; 90
310.081Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300455 CIF
Paper
C8 H9 N O2P 1 21/n 111.71439; 9.38544; 7.10166
90; 82.5879; 90
774.27Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667
2300456 CIF
HKL
Paper
C12 H24 O12P 1 21 17.77208; 21.58192; 4.8172
90; 74.0609; 90
776.95Schreyer, Martin; Guo, Liangfeng; Thirunahari, Satyanarayana; Gao, Feng; Garland, Marc
Simultaneous determination of several crystal structures from powder mixtures: the combination of powder X-ray diffraction, band-target entropy minimization and Rietveld methods
Journal of Applied Crystallography, 2014, 47, 659-667

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