Crystallography Open Database
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COD ID  |
Links | Formula  |
Space group |
Cell parameters | Cell volume |
Bibliography |
|---|---|---|---|---|---|---|
| 9012979 | CIF | Ni | F m -3 m | 3.5343; 3.5343; 3.5343 90; 90; 90 | 44.148 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 342 C Note: film 585 Philosophical Magazine, 1936, 21, 809-819 |
| 9012980 | CIF | Ni | F m -3 m | 3.5342; 3.5342; 3.5342 90; 90; 90 | 44.144 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 343 C Note: film 618 Philosophical Magazine, 1936, 21, 809-819 |
| 9012981 | CIF | Ni | F m -3 m | 3.5345; 3.5345; 3.5345 90; 90; 90 | 44.155 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 345 C Note: film 616 & 610 Philosophical Magazine, 1936, 21, 809-819 |
| 9012982 | CIF | Ni | F m -3 m | 3.5347; 3.5347; 3.5347 90; 90; 90 | 44.163 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 346 C Note: film 614 Philosophical Magazine, 1936, 21, 809-819 |
| 9012983 | CIF | Ni | F m -3 m | 3.5346; 3.5346; 3.5346 90; 90; 90 | 44.159 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 348 C Note: film 605 Philosophical Magazine, 1936, 21, 809-819 |
| 9012984 | CIF | Ni | F m -3 m | 3.5347; 3.5347; 3.5347 90; 90; 90 | 44.163 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 349 C Note: film 586 Philosophical Magazine, 1936, 21, 809-819 |
| 9012985 | CIF | Ni | F m -3 m | 3.535; 3.535; 3.535 90; 90; 90 | 44.174 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 352 C Note: film 612 Philosophical Magazine, 1936, 21, 809-819 |
| 9012986 | CIF | Ni | F m -3 m | 3.5355; 3.5355; 3.5355 90; 90; 90 | 44.193 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 356 C Note: film 624 Philosophical Magazine, 1936, 21, 809-819 |
| 9012987 | CIF | Ni | F m -3 m | 3.5356; 3.5356; 3.5356 90; 90; 90 | 44.197 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 359 C Note: film 592 Philosophical Magazine, 1936, 21, 809-819 |
| 9012988 | CIF | Ni | F m -3 m | 3.5359; 3.5359; 3.5359 90; 90; 90 | 44.208 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 362 C Note: film 599 Philosophical Magazine, 1936, 21, 809-819 |
| 9012989 | CIF | Ni | F m -3 m | 3.536; 3.536; 3.536 90; 90; 90 | 44.212 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 363 C Note: film 600 Philosophical Magazine, 1936, 21, 809-819 |
| 9012990 | CIF | Ni | F m -3 m | 3.5361; 3.5361; 3.5361 90; 90; 90 | 44.215 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 365 C Note: film 593 Philosophical Magazine, 1936, 21, 809-819 |
| 9012991 | CIF | Ni | F m -3 m | 3.5367; 3.5367; 3.5367 90; 90; 90 | 44.238 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 370 C Note: film 577 & 598 Philosophical Magazine, 1936, 21, 809-819 |
| 9012992 | CIF | Ni | F m -3 m | 3.5367; 3.5367; 3.5367 90; 90; 90 | 44.238 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 373 C Note: film 576 Philosophical Magazine, 1936, 21, 809-819 |
| 9012993 | CIF | Ni | F m -3 m | 3.5367; 3.5367; 3.5367 90; 90; 90 | 44.238 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 374 C Note: film 603 Philosophical Magazine, 1936, 21, 809-819 |
| 9012994 | CIF | Ni | F m -3 m | 3.5371; 3.5371; 3.5371 90; 90; 90 | 44.253 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 378 C Note: film 604 Philosophical Magazine, 1936, 21, 809-819 |
| 9012995 | CIF | Ni | F m -3 m | 3.5379; 3.5379; 3.5379 90; 90; 90 | 44.283 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 388 C Note: film 589 Philosophical Magazine, 1936, 21, 809-819 |
| 9012996 | CIF | Ni | F m -3 m | 3.5383; 3.5383; 3.5383 90; 90; 90 | 44.298 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 398 C Note: film 556 Philosophical Magazine, 1936, 21, 809-819 |
| 9012997 | CIF | Ni | F m -3 m | 3.5386; 3.5386; 3.5386 90; 90; 90 | 44.309 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 405 C Note: film 613 Philosophical Magazine, 1936, 21, 809-819 |
| 9012998 | CIF | Ni | F m -3 m | 3.5388; 3.5388; 3.5388 90; 90; 90 | 44.317 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 410 C Note: film 607 Philosophical Magazine, 1936, 21, 809-819 |
| 9012999 | CIF | Ni | F m -3 m | 3.5388; 3.5388; 3.5388 90; 90; 90 | 44.317 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample at T = 411 C Note: film 609 Philosophical Magazine, 1936, 21, 809-819 |
| 9013000 | CIF | Ni | F m -3 m | 3.5402; 3.5402; 3.5402 90; 90; 90 | 44.369 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 429 C Note: film 591 Philosophical Magazine, 1936, 21, 809-819 |
| 9013001 | CIF | Ni | F m -3 m | 3.5422; 3.5422; 3.5422 90; 90; 90 | 44.445 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 460 C Note: film 572 Philosophical Magazine, 1936, 21, 809-819 |
| 9013002 | CIF | Ni | F m -3 m | 3.5448; 3.5448; 3.5448 90; 90; 90 | 44.543 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 501 C Note: film 561 Philosophical Magazine, 1936, 21, 809-819 |
| 9013003 | CIF | Ni | F m -3 m | 3.5481; 3.5481; 3.5481 90; 90; 90 | 44.667 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 557 C Note: film 575 Philosophical Magazine, 1936, 21, 809-819 |
| 9013004 | CIF | Ni | F m -3 m | 3.5508; 3.5508; 3.5508 90; 90; 90 | 44.769 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 603 C Note: film 568 Philosophical Magazine, 1936, 21, 809-819 |
| 9013005 | CIF | Ni | F m -3 m | 3.5516; 3.5516; 3.5516 90; 90; 90 | 44.799 | Owen, E. A.; Yates, E. L. X-ray measurement of the thermal expansion of pure nickel Sample: at T = 608 C Note: film 615 Philosophical Magazine, 1936, 21, 809-819 |
| 9013006 | CIF | As | B m a b | 3.65; 4.47; 11 90; 90; 90 | 179.471 | Smith, P. M.; Leadbetter, A. J.; Apling, A. J. The structures of orthorhombic and vitrous arsenic Locality: synthetic Note: known as arsenolamprite Philosophical Magazine, 1975, 31, 57-64 |
| 9013007 | CIF | Ni | P 63/m m c | 2.622; 2.622; 4.321 90; 90; 120 | 25.726 | Weik, H.; Hemenger, P. Existence of the hexagonal modification of nickel Locality: synthetic Bulletin of the American Physical Society, 1965, 10, 1140-1140 |
| 9013008 | CIF | Sb | P m -3 m | 3.16; 3.16; 3.16 90; 90; 90 | 31.554 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Note: liquid-quenched specimen Journal of Materials Science, 1979, 14, 988-994 |
| 9013009 | CIF | Sb | F m -3 m | 4.61; 4.61; 4.61 90; 90; 90 | 97.972 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Locality: synthetic Note: liquid-quenched specimen Journal of Materials Science, 1979, 14, 988-994 |
| 9013010 | CIF | Sb | I 4/m m m | 3.01; 3.01; 4.96 90; 90; 90 | 44.938 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Note: liquid-quenched specimen Journal of Materials Science, 1979, 14, 988-994 |
| 9013011 | CIF | Sb | P 63/m m c | 3.33; 3.33; 5.23 90; 90; 120 | 50.225 | Akhtar, D.; Vankar, V. D.; Goel, T. C.; Chopra, K. L. Metastable structures of liquid-quenched and vapour-quenched antimony films Locality: synthetic Note: liquid-quenched specimen Note: HCP structure resulted from electron beam heating of the tetragonal, FCC and SC structures Journal of Materials Science, 1979, 14, 988-994 |
| 9013014 | CIF | Cu | F m -3 m | 3.613; 3.613; 3.613 90; 90; 90 | 47.163 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 293 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013015 | CIF | Cu | F m -3 m | 3.63; 3.63; 3.63 90; 90; 90 | 47.832 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 577 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013016 | CIF | Cu | F m -3 m | 3.636; 3.636; 3.636 90; 90; 90 | 48.07 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 680 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013017 | CIF | Cu | F m -3 m | 3.644; 3.644; 3.644 90; 90; 90 | 48.388 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 777 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013018 | CIF | Cu | F m -3 m | 3.65; 3.65; 3.65 90; 90; 90 | 48.627 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 874 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013019 | CIF | Cu | F m -3 m | 3.658; 3.658; 3.658 90; 90; 90 | 48.948 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 979 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013020 | CIF | Cu | F m -3 m | 3.667; 3.667; 3.667 90; 90; 90 | 49.31 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1076 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013021 | CIF | Cu | F m -3 m | 3.672; 3.672; 3.672 90; 90; 90 | 49.512 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1179 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013022 | CIF | Cu | F m -3 m | 3.684; 3.684; 3.684 90; 90; 90 | 49.999 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1275 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013023 | CIF | Cu | F m -3 m | 3.692; 3.692; 3.692 90; 90; 90 | 50.325 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1343 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013024 | CIF | Ni | F m -3 m | 3.524; 3.524; 3.524 90; 90; 90 | 43.763 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 293 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013025 | CIF | Ni | F m -3 m | 3.538; 3.538; 3.538 90; 90; 90 | 44.287 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 578 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013026 | CIF | Ni | F m -3 m | 3.544; 3.544; 3.544 90; 90; 90 | 44.512 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 676 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013027 | CIF | Ni | F m -3 m | 3.552; 3.552; 3.552 90; 90; 90 | 44.815 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 825 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013028 | CIF | Ni | F m -3 m | 3.563; 3.563; 3.563 90; 90; 90 | 45.232 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1007 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013029 | CIF | Ni | F m -3 m | 3.571; 3.571; 3.571 90; 90; 90 | 45.538 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1123 K Journal of Materials Science, 1988, 23, 757-760 |
| 9013030 | CIF | Ni | F m -3 m | 3.581; 3.581; 3.581 90; 90; 90 | 45.921 | Suh, I.-K.; Ohta, H.; Waseda, Y. High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction Sample: at T = 1256 K Journal of Materials Science, 1988, 23, 757-760 |
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