Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 42

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2300258 CIFCa H4 O6 SC 1 2/c 16.28689; 15.2131; 6.52996
90; 127.43; 90
495.95Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum
Journal of Applied Crystallography, 2009, 42, 1176-1188
2300250 CIFAlF m -3 m4.03702; 4.03702; 4.03702
90; 90; 90
65.793Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300256 CIFPbF m -3 m4.9108; 4.91075; 4.91075
90; 90; 90
118.426Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300257 CIFDI -4 2 d8.15; 8.15; 4
90; 90; 90
265.69Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300211 CIF
Paper
Lu2 O5 SiI 1 2/a 110.255; 6.6465; 12.3626
90; 102.422; 90
822.91Cong, Hengjiang; Zhang, Huaijin; Wang, Jiyang; Yu, Wentao; Fan, Jiandong; Cheng, Xiufeng; Sun, Shangqian; Zhang, Jian; Lu, Qingming; Jiang, Chunjian; Boughton, Robert I.
Structural and thermal properties of the monoclinic Lu~2~SiO~5~ single crystal: evaluation as a new laser matrix
Journal of Applied Crystallography, 2009, 42, 284-294
2300259 CIFCa H4 O6 SI 1 2/c 15.68021; 15.2139; 6.53032
90; 118.484; 90
496.03Henry, Paul F.; Weller, Mark T.; Wilson, Chick C.
Neutron powder diffraction in materials with incoherent scattering: an illustration of Rietveld refinement quality from nondeuterated gypsum
Journal of Applied Crystallography, 2009, 42, 1176-1188
2300262 CIF
HKL
Paper
C17 H30 F N3 O9P -19.507; 9.9649; 11.0233
94.182; 100.118; 91.432
1024.57Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A.
Towards extracting the charge density from normal-resolution data
Journal of Applied Crystallography, 2009, 42, 1110-1121
2300252 CIFC WP -6 m 22.9016; 2.90156; 2.83867
90; 90; 120
20.697Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300209 CIF
Paper
C46 H42 Fe O12P 1 21 15.857; 24.105; 14.069
90; 93.15; 90
1983.3Okabe, Takashi; Nakazaki, Keisuke; Igaue, Tsuyoshi; Nakamura, Naotake; Donnio, Bertrand; Guillon, Daniel; Gallani, Jean-Louis
Synthesis and physical properties of ferrocene derivatives. XXI. Crystal structure of a liquid crystalline ferrocene derivative, 1,1'-bis[3-[4-(4-methoxyphenoxycarbonyl)phenoxy]propyloxycarbonyl]ferrocene
Journal of Applied Crystallography, 2009, 42, 63-68
2300229 CIF
Paper
C8 H9 N O2P 1 21/a 112.88606; 9.38115; 7.10099
90; 115.701; 90
773.484Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300230 CIF
Paper
C8 H9 N O2P 1 21/a 112.88559; 9.38013; 7.10096
90; 115.7; 90
773.38Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300231 CIF
Paper
C8 H9 N O2P 1 21/a 112.8865; 9.3822; 7.10147
90; 115.702; 90
773.65Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300232 CIF
Paper
C8 H9 N O2P 1 21/a 112.89; 9.38466; 7.10325
90; 115.702; 90
774.26Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300233 CIF
Paper
C8 H9 N O2P 1 21/a 112.8863; 9.38162; 7.10158
90; 115.701; 90
773.61Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300234 CIF
Paper
C8 H9 N O2P 1 21/a 112.8871; 9.3824; 7.1018
90; 115.703; 90
773.73Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300235 CIF
Paper
C8 H9 N O2P 1 21/a 112.8905; 9.38488; 7.10342
90; 115.701; 90
774.32Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300236 CIF
Paper
C8 H9 N O2P 1 21/a 112.887; 9.3819; 7.1015
90; 115.701; 90
773.66Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300237 CIF
Paper
C8 H9 N O2P 1 21/a 112.8858; 9.3812; 7.1013
90; 115.703; 90
773.5Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300238 CIF
Paper
C8 H9 N O2P 1 21/a 112.889; 9.38347; 7.10271
90; 115.702; 90
774.04Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300239 CIF
Paper
C8 H9 N O2P 1 21/a 112.8856; 9.3812; 7.10114
90; 115.697; 90
773.5Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391

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