Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 42

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2300209 CIF
Paper
C46 H42 Fe O12P 1 21 15.857; 24.105; 14.069
90; 93.15; 90
1983.3Okabe, Takashi; Nakazaki, Keisuke; Igaue, Tsuyoshi; Nakamura, Naotake; Donnio, Bertrand; Guillon, Daniel; Gallani, Jean-Louis
Synthesis and physical properties of ferrocene derivatives. XXI. Crystal structure of a liquid crystalline ferrocene derivative, 1,1'-bis[3-[4-(4-methoxyphenoxycarbonyl)phenoxy]propyloxycarbonyl]ferrocene
Journal of Applied Crystallography, 2009, 42, 63-68
2300263 CIF
Paper
C17 H21.8 Cl F N3 O4.4P 1 21/c 112.872; 19.576; 6.948
90; 90.55; 90
1750.7Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A.
Towards extracting the charge density from normal-resolution data
Journal of Applied Crystallography, 2009, 42, 1110-1121
2300224 CIF
Paper
C13 H18 O2P 1 21/c 114.673; 7.8892; 10.7316
90; 99.436; 90
1225.45Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300213 CIF
Paper
C13 H18 O2P 1 21/c 114.6712; 7.8893; 10.7288
90; 99.428; 90
1225.05Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300227 CIF
Paper
C13 H18 O2P 1 21/c 114.67; 7.8886; 10.7304
90; 99.43; 90
1225Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300212 CIF
Paper
C13 H18 O2P 1 21/c 114.6696; 7.889; 10.7287
90; 99.427; 90
1224.85Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300218 CIF
Paper
C13 H18 O2P 1 21/c 114.6703; 7.889; 10.7282
90; 99.429; 90
1224.84Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300221 CIF
Paper
C13 H18 O2P 1 21/c 114.6706; 7.8885; 10.7284
90; 99.426; 90
1224.81Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300215 CIF
Paper
C13 H18 O2P 1 21/c 114.6689; 7.8884; 10.728
90; 99.429; 90
1224.61Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300216 CIF
Paper
C13 H18 O2P 1 21/c 114.6682; 7.8889; 10.7276
90; 99.437; 90
1224.55Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300219 CIF
Paper
C13 H18 O2P 1 21/c 114.6698; 7.8878; 10.7265
90; 99.432; 90
1224.41Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300214 CIF
Paper
C13 H18 O2P 1 21/c 114.6662; 7.8879; 10.7275
90; 99.432; 90
1224.23Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300217 CIF
Paper
C13 H18 O2P 1 21/c 114.6636; 7.8871; 10.7244
90; 99.417; 90
1223.6Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300225 CIF
Paper
C13 H18 O2P 1 21/c 114.669; 7.8804; 10.7272
90; 99.439; 90
1223.3Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300222 CIF
Paper
C13 H18 O2P 1 21/c 114.6655; 7.8817; 10.724
90; 99.427; 90
1222.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300228 CIF
Paper
C13 H18 O2P 1 21/c 114.683; 7.86; 10.729
90; 99.456; 90
1221.4Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300226 CIF
Paper
C13 H18 O2P 1 21/c 114.528; 7.7695; 10.691
90; 99.89; 90
1188.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300223 CIF
Paper
C13 H18 O2P 1 21/c 114.494; 7.7528; 10.6655
90; 99.875; 90
1180.7Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300220 CIF
Paper
C13 H18 O2P 1 21/c 114.499; 7.7576; 10.6203
90; 99.741; 90
1177.3Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300262 CIF
HKL
Paper
C17 H30 F N3 O9P -19.507; 9.9649; 11.0233
94.182; 100.118; 91.432
1024.57Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A.
Towards extracting the charge density from normal-resolution data
Journal of Applied Crystallography, 2009, 42, 1110-1121

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