Crystallography Open Database
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Result: there are 55 entries in the selection
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 42
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
---|---|---|---|---|---|---|
2300209 | CIF Paper | C46 H42 Fe O12 | P 1 21 1 | 5.857; 24.105; 14.069 90; 93.15; 90 | 1983.3 | Okabe, Takashi; Nakazaki, Keisuke; Igaue, Tsuyoshi; Nakamura, Naotake; Donnio, Bertrand; Guillon, Daniel; Gallani, Jean-Louis Synthesis and physical properties of ferrocene derivatives. XXI. Crystal structure of a liquid crystalline ferrocene derivative, 1,1'-bis[3-[4-(4-methoxyphenoxycarbonyl)phenoxy]propyloxycarbonyl]ferrocene Journal of Applied Crystallography, 2009, 42, 63-68 |
2300263 | CIF Paper | C17 H21.8 Cl F N3 O4.4 | P 1 21/c 1 | 12.872; 19.576; 6.948 90; 90.55; 90 | 1750.7 | Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A. Towards extracting the charge density from normal-resolution data Journal of Applied Crystallography, 2009, 42, 1110-1121 |
2300224 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.673; 7.8892; 10.7316 90; 99.436; 90 | 1225.45 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300213 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6712; 7.8893; 10.7288 90; 99.428; 90 | 1225.05 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300227 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.67; 7.8886; 10.7304 90; 99.43; 90 | 1225 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300212 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6696; 7.889; 10.7287 90; 99.427; 90 | 1224.85 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300218 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6703; 7.889; 10.7282 90; 99.429; 90 | 1224.84 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300221 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6706; 7.8885; 10.7284 90; 99.426; 90 | 1224.81 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300215 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6689; 7.8884; 10.728 90; 99.429; 90 | 1224.61 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300216 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6682; 7.8889; 10.7276 90; 99.437; 90 | 1224.55 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300219 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6698; 7.8878; 10.7265 90; 99.432; 90 | 1224.41 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300214 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6662; 7.8879; 10.7275 90; 99.432; 90 | 1224.23 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300217 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6636; 7.8871; 10.7244 90; 99.417; 90 | 1223.6 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300225 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.669; 7.8804; 10.7272 90; 99.439; 90 | 1223.3 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300222 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.6655; 7.8817; 10.724 90; 99.427; 90 | 1222.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300228 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.683; 7.86; 10.729 90; 99.456; 90 | 1221.4 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300226 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.528; 7.7695; 10.691 90; 99.89; 90 | 1188.8 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300223 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.494; 7.7528; 10.6655 90; 99.875; 90 | 1180.7 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300220 | CIF Paper | C13 H18 O2 | P 1 21/c 1 | 14.499; 7.7576; 10.6203 90; 99.741; 90 | 1177.3 | Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W. Implementation and use of robust refinement in powder diffraction in the presence of impurities Journal of Applied Crystallography, 2009, 42, 385-391 |
2300262 | CIF HKL Paper | C17 H30 F N3 O9 | P -1 | 9.507; 9.9649; 11.0233 94.182; 100.118; 91.432 | 1024.57 | Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A. Towards extracting the charge density from normal-resolution data Journal of Applied Crystallography, 2009, 42, 1110-1121 |
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