Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 42

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2300231 CIF
Paper
C8 H9 N O2P 1 21/a 112.8865; 9.3822; 7.10147
90; 115.702; 90
773.65Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300236 CIF
Paper
C8 H9 N O2P 1 21/a 112.887; 9.3819; 7.1015
90; 115.701; 90
773.66Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300234 CIF
Paper
C8 H9 N O2P 1 21/a 112.8871; 9.3824; 7.1018
90; 115.703; 90
773.73Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300244 CIF
Paper
C8 H9 N O2P 1 21/a 112.885; 9.3862; 7.1008
90; 115.714; 90
773.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300242 CIF
Paper
C8 H9 N O2P 1 21/a 112.8869; 9.3833; 7.1022
90; 115.706; 90
773.82Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300238 CIF
Paper
C8 H9 N O2P 1 21/a 112.889; 9.38347; 7.10271
90; 115.702; 90
774.04Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300241 CIF
Paper
C8 H9 N O2P 1 21/a 112.8887; 9.384; 7.1025
90; 115.702; 90
774.05Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300232 CIF
Paper
C8 H9 N O2P 1 21/a 112.89; 9.38466; 7.10325
90; 115.702; 90
774.26Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300235 CIF
Paper
C8 H9 N O2P 1 21/a 112.8905; 9.38488; 7.10342
90; 115.701; 90
774.32Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300243 CIF
Paper
C8 H9 N O2P 1 21/a 112.656; 9.564; 7.236
90; 117.1; 90
779.7Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300211 CIF
Paper
Lu2 O5 SiI 1 2/a 110.255; 6.6465; 12.3626
90; 102.422; 90
822.91Cong, Hengjiang; Zhang, Huaijin; Wang, Jiyang; Yu, Wentao; Fan, Jiandong; Cheng, Xiufeng; Sun, Shangqian; Zhang, Jian; Lu, Qingming; Jiang, Chunjian; Boughton, Robert I.
Structural and thermal properties of the monoclinic Lu~2~SiO~5~ single crystal: evaluation as a new laser matrix
Journal of Applied Crystallography, 2009, 42, 284-294
2300210 CIF
HKL
Paper
C2 H2 Ca O5P 1 21/c 16.316; 14.541; 10.116
90; 109; 90
878.4Daudon, Michel; Bazin, Dominique; André, Gilles; Jungers, Paul; Cousson, Alain; Chevallier, Pierre; Véron, Emmanuel; Matzen, Guy
Examination of whewellite kidney stones by scanning electron microscopy and powder neutron diffraction techniques
Journal of Applied Crystallography, 2009, 42, 109-115
2300254 CIFD2 OR -3 :H12.8396; 12.8396; 6.1628
90; 90; 120
879.86Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300249 CIFD2 OR -3 :H12.87078; 12.87078; 6.1827
90; 90; 120
886.99Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300248 CIFDP b c a18.8679; 6.94772; 6.85885
90; 90; 90
899.12Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300262 CIF
HKL
Paper
C17 H30 F N3 O9P -19.507; 9.9649; 11.0233
94.182; 100.118; 91.432
1024.57Dittrich, B.; Hübschle, C. B.; Holstein, J. J.; Fabbiani, F. P. A.
Towards extracting the charge density from normal-resolution data
Journal of Applied Crystallography, 2009, 42, 1110-1121
2300220 CIF
Paper
C13 H18 O2P 1 21/c 114.499; 7.7576; 10.6203
90; 99.741; 90
1177.3Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300223 CIF
Paper
C13 H18 O2P 1 21/c 114.494; 7.7528; 10.6655
90; 99.875; 90
1180.7Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300226 CIF
Paper
C13 H18 O2P 1 21/c 114.528; 7.7695; 10.691
90; 99.89; 90
1188.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300228 CIF
Paper
C13 H18 O2P 1 21/c 114.683; 7.86; 10.729
90; 99.456; 90
1221.4Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391

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