# Search results of SQL query from the Crystallography Open Database
# Date and time performed: 2024-07-02T17:34:08+02:00
# Query:
# SELECT data.*
# FROM
#  data JOIN jaltnames
#  ON altname = journal
# WHERE
#  (status is null or status != 'retracted') and
#  (journal_id IN (SELECT DISTINCT(journal_id) FROM jaltnames WHERE altname LIKE 'Advanced Materials') AND volume = 12 AND duplicateof IS NULL AND (status is NULL OR status != 'errors') AND (method is NULL OR method != 'theoretical'))
# ORDER BY file asc
file,a,siga,b,sigb,c,sigc,alpha,sigalpha,beta,sigbeta,gamma,siggamma,vol,sigvol,celltemp,sigcelltemp,diffrtemp,sigdiffrtemp,cellpressure,sigcellpressure,diffrpressure,sigdiffrpressure,thermalhist,pressurehist,compoundsource,nel,sg,sgHall,sgNumber,commonname,chemname,mineral,formula,calcformula,cellformula,Z,Zprime,acce_code,authors,title,journal,year,volume,issue,firstpage,lastpage,doi,method,radiation,wavelength,radType,radSymbol,Rall,Robs,Rref,wRall,wRobs,wRref,RFsqd,RI,gofall,gofobs,gofgt,gofref,duplicateof,optimal,status,flags,svnrevision,date,time,onhold
"1521371","5.7955","","5.7955","","11.6464","","90","","90","","90","","391.177","","","","","","","","","","","","","3","I -4 2 d","I -4 2bw","122","","","","- Cu0.978 In Se1.988 -","- Cu0.9776 In Se1.988 -","- Cu3.9104 In4 Se7.952 -","4","0.25","","Kaplan, L.; Leitus, G.; Lyakhovitskaya, V.; Frolow, F.; Hallak, H.; Kvick, A.; Cahen, D.","Synchrotron X-ray diffraction evidence for native defects in the photovoltaic semiconductor Cu In Se2","Advanced Materials","2000","12","5","366","370","10.1002/(SICI)1521-4095(200003)12:5<366::AID-ADMA366>3.0.CO;2-9","","","","","","","","","","","","","","","","","","","","","has coordinates","211196","2020-10-21","18:00:00",""
"1521373","5.7877","","5.7877","","11.6274","","90","","90","","90","","389.488","","","","","","","","","","","","","3","I -4 2 d","I -4 2bw","122","","","","- Cu0.974 In Se1.989 -","- Cu0.974 In Se1.9892 -","- Cu3.896 In4 Se7.9568 -","4","0.25","","Kaplan, L.; Leitus, G.; Lyakhovitskaya, V.; Frolow, F.; Hallak, H.; Kvick, A.; Cahen, D.","Synchrotron X-ray diffraction evidence for native defects in the photovoltaic semiconductor Cu In Se2","Advanced Materials","2000","12","5","366","370","10.1002/(SICI)1521-4095(200003)12:5<366::AID-ADMA366>3.0.CO;2-9","","","","","","","","","","","","","","","","","","","","","has coordinates","211196","2020-10-21","18:00:00",""