Crystallography Open Database
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Result: there are 2011 entries in the selection
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Searching journal of publication like 'Journal of the American Chemical Society' volume of publication is 132
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
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4103367 | CIF | Al Bi2 Br Cl4 Te2 | C 1 2/c 1 | 21.2247; 8.4778; 13.2264 90; 99.28; 90 | 2348.8 | Kanishka Biswas; Qichun Zhang; In Chung; Jung-Hwan Song; John Androulakis; Arthur J. Freeman; Mercouri G. Kanatzidis Synthesis in Ionic Liquids: [Bi2Te2Br](AlCl4), a Direct Gap Semiconductor with a Cationic Framework Journal of the American Chemical Society, 2010, 132, 14760-14762 |
4103366 | CIF | Al Br Cl4 Sb2 Te2 | C 1 2/c 1 | 21.216; 8.2816; 13.126 90; 98.71; 90 | 2279.7 | Kanishka Biswas; Qichun Zhang; In Chung; Jung-Hwan Song; John Androulakis; Arthur J. Freeman; Mercouri G. Kanatzidis Synthesis in Ionic Liquids: [Bi2Te2Br](AlCl4), a Direct Gap Semiconductor with a Cationic Framework Journal of the American Chemical Society, 2010, 132, 14760-14762 |
4102049 | CIF | As Br F12 Kr2 O | P 1 21/c 1 | 5.7166; 13.6438; 15.1053 90; 111.446; 90 | 1096.6 | David S. Brock; Jonathan J. Casalis de Pury; Hélène P. A. Mercier; Gary J. Schrobilgen; Bernard Silvi A Rare Example of a Krypton Difluoride Coordination Compound: [BrOF2][AsF6].2KrF2 Journal of the American Chemical Society, 2010, 132, 3533-3542 |
4102046 | CIF | As Li Se2 | C 1 c 1 | 12.2872; 5.5419; 5.5533 90; 113.117; 90 | 347.79 | Tarun K. Bera; Joon I. Jang; Jung-Hwan Song; Christos D. Malliakas; Arthur J. Freeman; John B. Ketterson; Mercouri G. Kanatzidis Soluble Semiconductors AAsSe2 (A = Li, Na) with a Direct-Band-Gap and Strong Second Harmonic Generation: A Combined Experimental and Theoretical Study Journal of the American Chemical Society, 2010, 132, 3484-3495 |
4102048 | CIF | As Li Se2 | P 1 | 5.55073; 5.58029; 5.57706 92.72; 90.8322; 91.516 | 172.471 | Tarun K. Bera; Joon I. Jang; Jung-Hwan Song; Christos D. Malliakas; Arthur J. Freeman; John B. Ketterson; Mercouri G. Kanatzidis Soluble Semiconductors AAsSe2 (A = Li, Na) with a Direct-Band-Gap and Strong Second Harmonic Generation: A Combined Experimental and Theoretical Study Journal of the American Chemical Society, 2010, 132, 3484-3495 |
4102047 | CIF | As Na Se2 | P 1 c 1 | 11.682; 5.9021; 11.8231 90; 90.446; 90 | 815.2 | Tarun K. Bera; Joon I. Jang; Jung-Hwan Song; Christos D. Malliakas; Arthur J. Freeman; John B. Ketterson; Mercouri G. Kanatzidis Soluble Semiconductors AAsSe2 (A = Li, Na) with a Direct-Band-Gap and Strong Second Harmonic Generation: A Combined Experimental and Theoretical Study Journal of the American Chemical Society, 2010, 132, 3484-3495 |
4102045 | CIF | As0.5 Li0.5 Se | F m -3 m | 5.557; 5.557; 5.557 90; 90; 90 | 171.6 | Tarun K. Bera; Joon I. Jang; Jung-Hwan Song; Christos D. Malliakas; Arthur J. Freeman; John B. Ketterson; Mercouri G. Kanatzidis Soluble Semiconductors AAsSe2 (A = Li, Na) with a Direct-Band-Gap and Strong Second Harmonic Generation: A Combined Experimental and Theoretical Study Journal of the American Chemical Society, 2010, 132, 3484-3495 |
4102868 | CIF | As4 S4 | P 1 21/n 1 | 9.3204; 13.5483; 6.5794 90; 106.479; 90 | 796.69 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102869 | CIF | As4 S4 | P 1 21/n 1 | 9.3198; 13.548; 6.579 90; 106.475; 90 | 796.59 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102870 | CIF | As4 S4 | P 1 21/n 1 | 9.3198; 13.5479; 6.5789 90; 106.472; 90 | 796.58 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102871 | CIF | As4 S4 | P 1 21/n 1 | 9.3199; 13.548; 6.5788 90; 106.468; 90 | 796.6 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102872 | CIF | As4 S4 | P 1 21/n 1 | 9.3203; 13.5485; 6.5792 90; 106.466; 90 | 796.72 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102873 | CIF | As4 S4 | P 1 21/n 1 | 9.3201; 13.548; 6.5789 90; 106.464; 90 | 796.65 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102874 | CIF | As4 S4 | P 1 21/n 1 | 9.3204; 13.548; 6.5788 90; 106.46; 90 | 796.68 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102875 | CIF | As4 S4 | P 1 21/n 1 | 9.3208; 13.5481; 6.5791 90; 106.456; 90 | 796.77 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102876 | CIF | As4 S4 | P 1 21/n 1 | 9.3211; 13.5484; 6.579 90; 106.45; 90 | 796.83 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102877 | CIF | As4 S4 | P 1 21/n 1 | 9.3214; 13.5483; 6.5792 90; 106.446; 90 | 796.89 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102878 | CIF | As4 S4 | P 1 21/n 1 | 9.3218; 13.549; 6.5793 90; 106.44; 90 | 797 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102879 | CIF | As4 S4 | P 1 21/n 1 | 9.3218; 13.5491; 6.5792 90; 106.437; 90 | 797.01 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
4102880 | CIF | As4 S4 | P 1 21/n 1 | 9.3222; 13.549; 6.5794 90; 106.433; 90 | 797.07 | Panče Naumov; Petre Makreski; Gjorgji Petruševski; Tomče Runčevski; Gligor Jovanovski Visualization of a Discrete Solid-State Process with Steady-State X-ray Diffraction: Observation of Hopping of Sulfur Atoms in Single Crystals of Realgar Journal of the American Chemical Society, 2010, 132, 11398-11401 |
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