Crystallography Open Database
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Result: there are 7 entries in the selection
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Searching journal of publication like 'Journal of Applied Physics' volume of publication is 70
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
---|---|---|---|---|---|---|
1510696 | CIF | B2 Fe27 Mn Y4 | P 42/m n m | 8.7441; 8.7441; 12.0108 90; 90; 90 | 918.337 | Long, G.J.; Yelon, W.B.; Grandjean, F.; James, W.J.; Marasinghe, G.K.; Pringle, O.A. A neutron-diffraction and Moessbauer-effect study of Pr2 (Fe1-x Mnx)14 B Journal of Applied Physics, 1991, 70, 6149-6151 |
1511159 | CIF | B Fe9 Mn5 Y2 | P 42/m n m | 8.7101; 8.7101; 11.9616 90; 90; 90 | 907.477 | Yelon, W.B.; Marasinghe, G.K.; Pringle, O.A.; Long, G.J.; James, W.J.; Grandjean, F. A neutron-diffraction and Moessbauer-effect study of Pr2 (Fe1-x Mnx)14 B Journal of Applied Physics, 1991, 70, 6149-6151 |
1527391 | CIF | Eu0.81 S Tb0.19 | F m -3 m | 5.81; 5.81; 5.81 90; 90; 90 | 196.123 | Gambino, R.J.; Ruf, R.R.; McGuire, T.R.; Fumagalli, P. Magnetic, magneto-optic, and transport properties of Tb-doped EuS films Journal of Applied Physics, 1991, 70, 6386-6388 |
1527959 | CIF | Fe10 Mo2 Sm | I 4/m m m | 8.5869; 8.5869; 4.8002 90; 90; 90 | 353.942 | Psycharis, V.; Christides, C.; Anagnostou, M.; Niarchos, D. Rietveld analysis of X-ray powder diffraction patterns for the new Sm Fe10 Mo2 Nx nitride compound Journal of Applied Physics, 1991, 70, 6122-6124 |
1540784 | CIF | Fe17 N2.56 Nd2 | R -3 m :H | 8.762; 8.762; 12.631 90; 90; 120 | 839.798 | Yang, Y.; Yang, J.; Kong, L.; Pan, Q.; Zhang, X.; Ding, Y.; Zhang, B.; Ye, C.; Jin, L. Neutron diffraction study of ternary nitrides of the type R2Fe17Nx Journal of Applied Physics, 1991, 70, 6018-6020 |
1540785 | CIF | Fe17 N2.5 Y2 | P 63/m m c | 8.653; 8.653; 8.451 90; 90; 120 | 547.989 | Yang, Y.; Kong, L.; Zhang, X.; Ding, Y.; Pan, Q.; Jin, L.; Yang, J.; Ye, C.; Zhang, B. Neutron diffraction study of ternary nitrides of the type R2 Fe17 Nx Journal of Applied Physics, 1991, 70, 6018-6020 |
1541144 | CIF | Fe10 Mo2 N Sm | I 4/m m m | 8.6781; 8.6781; 4.8531 90; 90; 90 | 365.484 | Psycharis, V.; Anagnostou, M.; Christides, C.; Niarchos, D. Rietveld analysis of x-ray powder diffraction patterns for the new SmFe10Mo2Nx nitride compound Journal of Applied Physics, 1991, 70, 6122-6124 |
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