Information card for entry 1502754
| Chemical name |
2,6-diiodothieno[3,3-b:2',3'-d]thiophene |
| Formula |
C8 H2 I2 S3 |
| Calculated formula |
C8 H2 I2 S3 |
| SMILES |
Ic1sc2c3sc(I)cc3sc2c1 |
| Title of publication |
Electronic properties of the 2,6-diiododithieno[3,2-b:2',3'-d]thiophene molecule and crystal: a joint experimental and theoretical study. |
| Authors of publication |
Sánchez-Carrera, Roel S; Odom, Susan A.; Kinnibrugh, Tiffany L.; Sajoto, Tissa; Kim, Eung-Gun; Timofeeva, Tatiana V.; Barlow, Stephen; Coropceanu, Veaceslav; Marder, Seth R.; Brédas, Jean-Luc |
| Journal of publication |
The journal of physical chemistry. B |
| Year of publication |
2010 |
| Journal volume |
114 |
| Journal issue |
2 |
| Pages of publication |
749 - 755 |
| a |
13.223 ± 0.009 Å |
| b |
4.161 ± 0.003 Å |
| c |
19.785 ± 0.014 Å |
| α |
90° |
| β |
96.339 ± 0.01° |
| γ |
90° |
| Cell volume |
1081.9 ± 1.3 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0939 |
| Residual factor for significantly intense reflections |
0.0635 |
| Weighted residual factors for significantly intense reflections |
0.1397 |
| Weighted residual factors for all reflections included in the refinement |
0.1521 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.052 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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