Information card for entry 1504392
| Common name |
1 |
| Formula |
C52 H34 S2 |
| Calculated formula |
C52 H34 S2 |
| SMILES |
s1c(ccc1c1sc(cc1)c1c(c(c(c(c1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1c2ccccc2cc2ccccc12 |
| Title of publication |
Unsymmetrical Dendrimers as Highly Efficient Light-Emitting Materials: Synthesis, Photophysics, and Electroluminescence |
| Authors of publication |
Zhang, Hengjun; Xu, Xinjun; Qiu, Wenfeng; Qi, Ting; Gao, Xike; Liu, Ying; Lu, Kun; Du, Chunyan; Yu, Gui; Liu, Yunqi |
| Journal of publication |
Journal of Physical Chemistry C |
| Year of publication |
2008 |
| Journal volume |
112 |
| Journal issue |
34 |
| Pages of publication |
13258 |
| a |
10.1667 ± 0.0005 Å |
| b |
11.0179 ± 0.0006 Å |
| c |
18.5125 ± 0.0014 Å |
| α |
90.36 ± 0.002° |
| β |
96.885 ± 0.002° |
| γ |
111.722 ± 0.003° |
| Cell volume |
1909.7 ± 0.2 Å3 |
| Cell temperature |
113 ± 2 K |
| Ambient diffraction temperature |
113 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0444 |
| Residual factor for significantly intense reflections |
0.0375 |
| Weighted residual factors for significantly intense reflections |
0.0944 |
| Weighted residual factors for all reflections included in the refinement |
0.0993 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.055 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1504392.html