Information card for entry 1504598
| Common name |
05274 |
| Formula |
C37 H27 N7 S2 |
| Calculated formula |
C37 H27 N7 S2 |
| SMILES |
N#CC(=C(C#N)C#N)c1sc2c(c1)n(c1c2sc(c1)C(=C(C#N)C#N)C#N)c1ccc(cc1)CCCCCC.c1(ccccc1)C |
| Title of publication |
Reduced band gap dithieno[3,2-b:2',3'-d]pyrroles: new n-type organic materials via unexpected reactivity. |
| Authors of publication |
Pappenfus, Ted M.; Hermanson, Bethany J.; Helland, Tyler J.; Lee, Garett G. W.; Drew, Steven M.; Mann, Kent R.; McGee, Kari A.; Rasmussen, Seth C. |
| Journal of publication |
Organic letters |
| Year of publication |
2008 |
| Journal volume |
10 |
| Journal issue |
8 |
| Pages of publication |
1553 - 1556 |
| a |
8.0559 ± 0.0007 Å |
| b |
10.018 ± 0.0009 Å |
| c |
21.3683 ± 0.0019 Å |
| α |
98.738 ± 0.002° |
| β |
95.006 ± 0.002° |
| γ |
104.636 ± 0.002° |
| Cell volume |
1634.9 ± 0.3 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0743 |
| Residual factor for significantly intense reflections |
0.0503 |
| Weighted residual factors for significantly intense reflections |
0.1294 |
| Weighted residual factors for all reflections included in the refinement |
0.1525 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.088 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/1504598.html