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Information card for entry 1505056
Preview
| Coordinates | 1505056.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H24 Ar1.04 Cu2 N2 O8 |
|---|---|
| Calculated formula | C32 H24 Ar1.02 Cu2 N2 O8 |
| Title of publication | Local Structure and Xenon Adsorption Behavior of Metal-Organic Framework System [M2(O2CPh)4(pyz)]n (M = Rh and Cu) As Studied with Use of Single-Crystal X-ray Diffraction, Adsorption Isotherm, and Xenon-129 NMR |
| Authors of publication | Ueda, T.; Kurokawa, K.; Eguchi, T.; Kachi-Terajima, C.; Takamizawa, S. |
| Journal of publication | Journal of Physical Chemistry C |
| Year of publication | 2007 |
| Journal volume | 111 |
| Journal issue | 3 |
| Pages of publication | 1524 |
| a | 18.396 ± 0.004 Å |
| b | 9.702 ± 0.002 Å |
| c | 19.188 ± 0.004 Å |
| α | 90° |
| β | 98.001 ± 0.005° |
| γ | 90° |
| Cell volume | 3391.3 ± 1.2 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1652 |
| Residual factor for significantly intense reflections | 0.0685 |
| Weighted residual factors for significantly intense reflections | 0.1512 |
| Weighted residual factors for all reflections included in the refinement | 0.1924 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.954 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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