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Information card for entry 1505497
Preview
| Coordinates | 1505497.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Me2 6T O4 |
|---|---|
| Formula | C21.25 H25.5 Cl0.5 O2 S3 |
| Calculated formula | C21.25 H25.5 Cl0.5 O2 S3 |
| Title of publication | Reverse selectivity in m-CPBA oxidation of oligothiophenes to sulfones. |
| Authors of publication | Pappenfus, Ted M.; Melby, Jacob H.; Hansen, Brent B.; Sumption, Devin M.; Hubers, Scott A.; Janzen, Daron E.; Ewbank, Paul C.; McGee, Kari A.; Burand, Michael W.; Mann, Kent R. |
| Journal of publication | Organic letters |
| Year of publication | 2007 |
| Journal volume | 9 |
| Journal issue | 19 |
| Pages of publication | 3721 - 3724 |
| a | 8.142 ± 0.0016 Å |
| b | 10.833 ± 0.002 Å |
| c | 13.146 ± 0.003 Å |
| α | 103.28 ± 0.03° |
| β | 103.16 ± 0.03° |
| γ | 95.53 ± 0.03° |
| Cell volume | 1085.3 ± 0.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0594 |
| Residual factor for significantly intense reflections | 0.0509 |
| Weighted residual factors for significantly intense reflections | 0.1403 |
| Weighted residual factors for all reflections included in the refinement | 0.146 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.068 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1505497.html
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