Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1506002
Preview
| Coordinates | 1506002.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H27 N3 O6 |
|---|---|
| Calculated formula | C42.004 H27 N3 O6 |
| SMILES | O=C(C(=C1c2c(c3c(c4ccccc4C3=C(C#N)C(=O)OCC)c3C(c4ccccc4c23)=C(C#N)C(=O)OCC)c2ccccc12)C#N)OCC |
| Title of publication | A new N-type organic semiconductor synthesized by knoevenagel condensation of truxenone and ethyl cyanoacetate. |
| Authors of publication | Zhang, Xin-Ran; Chao, Wei; Chuai, Yu-Tao; Ma, Yan; Hao, Rui; Zou, De-Chun; Wei, Yong-Ge; Wang, Yuan |
| Journal of publication | Organic letters |
| Year of publication | 2006 |
| Journal volume | 8 |
| Journal issue | 12 |
| Pages of publication | 2563 - 2566 |
| a | 9.442 ± 0.0019 Å |
| b | 14.643 ± 0.003 Å |
| c | 23.704 ± 0.005 Å |
| α | 90° |
| β | 93.98 ± 0.03° |
| γ | 90° |
| Cell volume | 3269.4 ± 1.2 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.2092 |
| Residual factor for significantly intense reflections | 0.0592 |
| Weighted residual factors for significantly intense reflections | 0.0884 |
| Weighted residual factors for all reflections included in the refinement | 0.1152 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.865 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1506002.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.