Information card for entry 1507231
| Formula |
C32 H22 Si |
| Calculated formula |
C32 H22 Si |
| SMILES |
[Si]1(C#C)(C#C)C(=C(c2ccccc2)C(=C1c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication |
Hyperbranched Poly(phenylenesilolene)s: Synthesis, Thermal Stability, Electronic Conjugation, Optical Power Limiting, and Cooling-Enhanced Light Emission |
| Authors of publication |
Chen, Junwu; Peng, Han; Law, Charles C. W.; Dong, Yuping; Lam, Jacky W. Y.; Williams, Ian D.; Tang, Ben Zhong |
| Journal of publication |
Macromolecules |
| Year of publication |
2003 |
| Journal volume |
36 |
| Journal issue |
12 |
| Pages of publication |
4319 |
| a |
11.1276 ± 0.0008 Å |
| b |
12.5644 ± 0.0009 Å |
| c |
18.1209 ± 0.0013 Å |
| α |
106.305 ± 0.001° |
| β |
99.974 ± 0.001° |
| γ |
90.573 ± 0.001° |
| Cell volume |
2390.3 ± 0.3 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0718 |
| Residual factor for significantly intense reflections |
0.0474 |
| Weighted residual factors for significantly intense reflections |
0.0746 |
| Weighted residual factors for all reflections included in the refinement |
0.0816 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.883 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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