Information card for entry 1507345
| Chemical name |
2,7,12,17-tetraethyl-3,6,13,16-tetrakis(trifluoromethyl)porphycene |
| Formula |
C32 H26 F12 N4 |
| Calculated formula |
C32 H26 F12 N4 |
| SMILES |
c12c(c(c(c3c(c(c(=CC=c4c(c(c(=c5c(c(c(C=C1)n5)CC)C(F)(F)F)[nH]4)C(F)(F)F)CC)n3)CC)C(F)(F)F)[nH]2)C(F)(F)F)CC |
| Title of publication |
Synthesis, structure, and chemical property of the first fluorine-containing porphycene. |
| Authors of publication |
Hayashi, Takashi; Nakashima, Yuji; Ito, Kazuyuki; Ikegami, Takahiro; Aritome, Isao; Suzuki, Akihiro; Hisaeda, Yoshio |
| Journal of publication |
Organic letters |
| Year of publication |
2003 |
| Journal volume |
5 |
| Journal issue |
16 |
| Pages of publication |
2845 - 2848 |
| a |
22.7324 ± 0.0015 Å |
| b |
9.6336 ± 0.0006 Å |
| c |
26.7417 ± 0.0018 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
5856.3 ± 0.7 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
61 |
| Hermann-Mauguin space group symbol |
P b c a |
| Hall space group symbol |
-P 2ac 2ab |
| Residual factor for all reflections |
0.0943 |
| Residual factor for significantly intense reflections |
0.0723 |
| Weighted residual factors for significantly intense reflections |
0.1424 |
| Weighted residual factors for all reflections included in the refinement |
0.1522 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.196 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1507345.html