Information card for entry 1508010

Structure parameters

• Common name: Compound 2c
• Chemical name: Compound 2c
• Formula: C56 H48 F24 N2 O4 Si2
• Calculated formula: C56 H48 F24 N2 O4 Si2
• SMILES: [Si]12([Si]34(OC(c5c3cccc5)(C(F)(F)F)C(F)(F)F)OC(c3c4cccc3)(C(F)(F)F)C(F)(F)F)(OC(c3c1cccc3)(C(F)(F)F)C(F)(F)F)OC(c1c2cccc1)(C(F)(F)F)C(F)(F)F.[N+](C)(C)(C)Cc1ccccc1.[N+](C)(C)(C)Cc1ccccc1
• Title of publication: Dianionic species with a bond consisting of two pentacoordinated silicon atoms.
• Authors of publication: Kano, Naokazu; Miyake, Hideaki; Sasaki, Keishi; Kawashima, Takayuki; Mizorogi, Naomi; Nagase, Shigeru
• Journal of publication: Nature chemistry
• Year of publication: 2010
• Journal volume: 2
• Journal issue: 2
• Pages of publication: 112 - 116
• a: 17.113 ± 0.003 Å
• b: 16.1501 ± 0.0017 Å
• c: 20.618 ± 0.004 Å
• α: 90°
• β: 107.588 ± 0.002°
• γ: 90°
• Cell volume: 5432 ± 1.5 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 ± 2 K
• Number of distinct elements: 6
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0433
• Residual factor for significantly intense reflections: 0.0374
• Weighted residual factors for significantly intense reflections: 0.1015
• Weighted residual factors for all reflections included in the refinement: 0.1075
• Goodness-of-fit parameter for all reflections included in the refinement: 1.072
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No