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Information card for entry 1512946
Preview
| Coordinates | 1512946.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H74 Cl2 N2 Ni2 S15 |
|---|---|
| Calculated formula | C42 H74 Cl2 N2 Ni2 S15 |
| SMILES | [Ni]1234[Ni]5([S]1C1SC(=S)SC=1S3)([S]4C1SC(=S)SC=1S2)SC1SC(=S)SC=1S5.[N+](CCCC)(CCCC)(CCCC)CCCC.C(C[N+](CCCC)(CCCC)CCCC)CC.ClCCl |
| Title of publication | Studies on α-C~3~S~5~^2-^ (dmit^2^) and its dinuclear Ni(II) complex: spectroscopic and structural characterization |
| Authors of publication | Jonathan G. Breitzer; Thomas B. Rauchfuss |
| Journal of publication | Polyhedron |
| Year of publication | 2000 |
| Journal volume | 19 |
| Journal issue | 10 |
| Pages of publication | 1283 - 1291 |
| a | 17.7947 ± 0.0005 Å |
| b | 14.4615 ± 0.0004 Å |
| c | 23.7863 ± 0.0006 Å |
| α | 90° |
| β | 102.38° |
| γ | 90° |
| Cell volume | 5978.8 ± 0.3 Å3 |
| Cell temperature | 198 ± 2 K |
| Ambient diffraction temperature | 198 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1424 |
| Residual factor for significantly intense reflections | 0.0665 |
| Weighted residual factors for significantly intense reflections | 0.1032 |
| Weighted residual factors for all reflections included in the refinement | 0.1305 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.077 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1512946.html
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