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Information card for entry 1513252
Preview
| Coordinates | 1513252.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | Ba O3 Ti |
|---|---|
| Calculated formula | Ba O3 Ti |
| Title of publication | X-ray diffractometry for the structure determination of a submicrometre single powder grain |
| Authors of publication | Yasuda, Nobuhiro; Murayama, Haruno; Fukuyama, Yoshimitsu; Kim, Jungeun; Kimura, Shigeru; Toriumi, Koshiro; Tanaka, Yoshihito; Moritomo, Yutaka; Kuroiwa, Yoshihiro; Kato, Kenichi; Tanaka, Hitoshi; Takata, Masaki |
| Journal of publication | Journal of Synchrotron Radiation |
| Year of publication | 2009 |
| Journal volume | 16 |
| Journal issue | 3 |
| Pages of publication | 352 - 357 |
| a | 3.9905 ± 0.0013 Å |
| b | 3.9905 ± 0.0013 Å |
| c | 4.0412 ± 0.0014 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 64.35 ± 0.04 Å3 |
| Cell temperature | 300 ± 2 K |
| Ambient diffraction temperature | 300 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 99 |
| Hermann-Mauguin space group symbol | P 4 m m |
| Hall space group symbol | P 4 -2 |
| Residual factor for all reflections | 0.0575 |
| Residual factor for significantly intense reflections | 0.0524 |
| Weighted residual factors for significantly intense reflections | 0.0994 |
| Weighted residual factors for all reflections included in the refinement | 0.1024 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.168 |
| Diffraction radiation wavelength | 0.83351 Å |
| Diffraction radiation type | Synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1513252.html
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