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Information card for entry 1514415
Preview
| Coordinates | 1514415.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H52 N2 P Si4 Y |
|---|---|
| Calculated formula | C31 H52 N2 P Si4 Y |
| SMILES | [Y]1(C[P+](c2c1cccc2)(c1ccccc1)c1ccccc1)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C |
| Title of publication | A metal‒amide dependent, catalytic C‒H functionalisation of triphenylphosphonium methylide |
| Authors of publication | Nako, Adi E.; White, Andrew J. P.; Crimmin, Mark R. |
| Journal of publication | Chemical Science |
| Year of publication | 2013 |
| Journal volume | 4 |
| Journal issue | 2 |
| Pages of publication | 691 |
| a | 11.1459 ± 0.0003 Å |
| b | 20.7732 ± 0.0004 Å |
| c | 16.6276 ± 0.0003 Å |
| α | 90° |
| β | 100.782 ± 0.0019° |
| γ | 90° |
| Cell volume | 3781.92 ± 0.14 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0829 |
| Residual factor for significantly intense reflections | 0.0406 |
| Weighted residual factors for significantly intense reflections | 0.0841 |
| Weighted residual factors for all reflections included in the refinement | 0.0923 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1514415.html
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Users of the data should acknowledge the original authors of the
structural data.