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Information card for entry 1514577
Preview
| Coordinates | 1514577.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H40 P4 Se8 U |
|---|---|
| Calculated formula | C48 H40 P4 Se8 U |
| SMILES | [U]1234([Se]=P([Se]1)(c1ccccc1)c1ccccc1)([Se]=P([Se]2)(c1ccccc1)c1ccccc1)([Se]=P([Se]3)(c1ccccc1)c1ccccc1)[Se]=P([Se]4)(c1ccccc1)c1ccccc1 |
| Title of publication | Uncovering f-element bonding differences and electronic structure in a series of 1 : 3 and 1 : 4 complexes with a diselenophosphinate ligand |
| Authors of publication | Jones, Matthew B.; Gaunt, Andrew J.; Gordon, John C.; Kaltsoyannis, Nikolas; Neu, Mary P.; Scott, Brian L. |
| Journal of publication | Chemical Science |
| Year of publication | 2013 |
| Journal volume | 4 |
| Journal issue | 3 |
| Pages of publication | 1189 |
| a | 13.8131 ± 0.0006 Å |
| b | 9.7933 ± 0.0005 Å |
| c | 18.8547 ± 0.0009 Å |
| α | 90° |
| β | 91.597 ± 0.001° |
| γ | 90° |
| Cell volume | 2549.6 ± 0.2 Å3 |
| Cell temperature | 120 ± 1 K |
| Ambient diffraction temperature | 120 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0276 |
| Residual factor for significantly intense reflections | 0.0226 |
| Weighted residual factors for significantly intense reflections | 0.0463 |
| Weighted residual factors for all reflections included in the refinement | 0.0474 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.659 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1514577.html
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Users of the data should acknowledge the original authors of the
structural data.