Information card for entry 1518412
| Chemical name |
TPP-4M |
| Formula |
C32 H28 N2 O4 |
| Calculated formula |
C32 H28 N2 O4 |
| SMILES |
O(c1ccc(c2nc(c(nc2c2ccc(OC)cc2)c2ccc(OC)cc2)c2ccc(OC)cc2)cc1)C |
| Title of publication |
Tetraphenylpyrazine-based AIEgens: facile preparation and tunable light emission |
| Authors of publication |
Chen, Ming; Li, Lingzhi; Nie, Han; Tong, Jiaqi; Yan, Lulin; Xu, Bin; Sun, Jing Zhi; Tian, Wenjing; Zhao, Zujin; Qin, Anjun; Tang, Ben Zhong |
| Journal of publication |
Chem. Sci. |
| Year of publication |
2015 |
| Journal volume |
6 |
| Journal issue |
3 |
| Pages of publication |
1932 |
| a |
9.768 ± 0.0011 Å |
| b |
12.3063 ± 0.0014 Å |
| c |
12.4687 ± 0.0014 Å |
| α |
68.542 ± 0.011° |
| β |
70.492 ± 0.01° |
| γ |
88.089 ± 0.009° |
| Cell volume |
1308.1 ± 0.3 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.1215 |
| Residual factor for significantly intense reflections |
0.0894 |
| Weighted residual factors for significantly intense reflections |
0.2711 |
| Weighted residual factors for all reflections included in the refinement |
0.2907 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.102 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/1518412.html
