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Information card for entry 1519154
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| Coordinates | 1519154.cif |
|---|
| Formula | C24 H16 Fe N2 O4 W |
|---|---|
| Calculated formula | C24 H16 Fe N2 O4 W |
| SMILES | [W]1([n]2c([c]34[Fe]56789%10%11([cH]%12[cH]5[cH]6[cH]7[cH]8%12)[cH]3[cH]9[cH]%10[cH]4%11)cccc2c2[n]1cccc2)(C#[O])(C#[O])(C#[O])C#[O] |
| Title of publication | C24H16FeN2O4W |
| Authors of publication | Butler, I. R.; Coles, Simon J.; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 1995 |
| Pages of publication | 755 |
| a | 11.732 ± 0.003 Å |
| b | 16.0425 ± 0.0015 Å |
| c | 12.2877 ± 0.0013 Å |
| α | 90° |
| β | 113.566 ± 0.01° |
| γ | 90° |
| Cell volume | 2119.8 ± 0.6 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0439 |
| Residual factor for significantly intense reflections | 0.0354 |
| Weighted residual factors for all reflections | 0.0852 |
| Weighted residual factors for significantly intense reflections | 0.0833 |
| Goodness-of-fit parameter for all reflections | 1.023 |
| Goodness-of-fit parameter for significantly intense reflections | 1.106 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1519154.html
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