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Information card for entry 1519325
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| Coordinates | 1519325.cif |
|---|---|
| External links | PubChem |
| Formula | C64 H76 F N O12 Si8 |
|---|---|
| Calculated formula | C64 H76 F N O12 Si8 |
| SMILES | [Si]12(O[Si]3(O[Si]4(O[Si](O1)(O[Si]1(O[Si](O[Si](O[Si](O1)(O2)c1ccccc1)(O3)c1ccccc1)(O4)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1.[F-].[N+](CCCC)(CCCC)(CCCC)CCCC |
| Title of publication | Tetra-n-butylammonium octaphenyloctasilasesquioxane fluoride clathrate |
| Authors of publication | Light, Mark E.; Hursthouse, Michael B.; Taylor, P. G.; Pourny, M.; Bassindale, A. R. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 2001 |
| Pages of publication | 128 |
| a | 23.8267 ± 0.0004 Å |
| b | 12.9976 ± 0.0003 Å |
| c | 22.1794 ± 0.0005 Å |
| α | 90° |
| β | 108.155 ± 0.0012° |
| γ | 90° |
| Cell volume | 6526.8 ± 0.2 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.056 |
| Residual factor for significantly intense reflections | 0.0397 |
| Weighted residual factors for significantly intense reflections | 0.105 |
| Weighted residual factors for all reflections included in the refinement | 0.1134 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1519325.html
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