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Information card for entry 1519518
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| Coordinates | 1519518.cif |
|---|---|
| External links | PubChem |
| Formula | C24 H36 O18 Si12 |
|---|---|
| Calculated formula | C24 H36 O18 Si12 |
| SMILES | [Si]12(O[Si]3(O[Si]4(O[Si]5(O[Si](O[Si]6(O[Si](O[Si]7(O[Si](O[Si](O4)(O[Si](O[Si](O6)(O5)C=C)(O7)C=C)C=C)(O2)C=C)C=C)(O1)C=C)C=C)(O3)C=C)C=C)C=C)C=C)C=C |
| Title of publication | C24H36O18Si12 |
| Authors of publication | Taylor, Peter G.; Horton, Peter N.; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 2002 |
| Pages of publication | 934 |
| a | 17.4597 ± 0.0007 Å |
| b | 17.3538 ± 0.0007 Å |
| c | 28.3363 ± 0.0014 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8585.7 ± 0.6 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.3015 |
| Residual factor for significantly intense reflections | 0.1434 |
| Weighted residual factors for significantly intense reflections | 0.3186 |
| Weighted residual factors for all reflections included in the refinement | 0.3783 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1519518.html
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