Information card for entry 1542485
| Chemical name |
<i>cis</i>,<i>trans</i>,<i>cis</i>-1,2,3,4-Tetrakis[2-(ethylsulfanyl)phenyl]cyclobutane |
| Formula |
C36 H40 S4 |
| Calculated formula |
C36 H40 S4 |
| SMILES |
S(c1c(C2C(C(C2c2c(SCC)cccc2)c2c(SCC)cccc2)c2c(SCC)cccc2)cccc1)CC |
| Title of publication |
<i>cis</i>,<i>trans</i>,<i>cis</i>-1,2,3,4-Tetrakis[2-(ethylsulfanyl)phenyl]cyclobutane |
| Authors of publication |
Sohr, Barbara; Glöcklhofer, Florian; Stöger, Berthold; Weil, Matthias; Fröhlich, Johannes |
| Journal of publication |
IUCrData |
| Year of publication |
2016 |
| Journal volume |
1 |
| Journal issue |
1 |
| Pages of publication |
x152426 |
| a |
11.2972 ± 0.0008 Å |
| b |
13.0708 ± 0.001 Å |
| c |
21.3833 ± 0.0017 Å |
| α |
90° |
| β |
98.4 ± 0.002° |
| γ |
90° |
| Cell volume |
3123.7 ± 0.4 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
3 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0531 |
| Residual factor for significantly intense reflections |
0.0409 |
| Weighted residual factors for significantly intense reflections |
0.0572 |
| Weighted residual factors for all reflections included in the refinement |
0.058 |
| Goodness-of-fit parameter for all reflections included in the refinement |
3.21 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/1542485.html