Information card for entry 1542756
| Common name |
[η2(N,N)-Ph2Si(DippN)2Ge(μ-S)]2 |
| Chemical name |
1,3,7,9-Tetrakis[2,6-bis(1-methylethyl)phenyl]-2,2,8,8-tetraphenyl-5,10-dithia-1,3,7,9-tetraaza-2,8-disila-4,6-digermadispiro[3.1.3.1]decane acetonitrile monosolvate |
| Formula |
C74 H91 Ge2 N5 S2 Si2 |
| Calculated formula |
C74 H91 Ge2 N5 S2 Si2 |
| Title of publication |
1,3,7,9-Tetrakis[2,6-bis(1-methylethyl)phenyl]-2,2,8,8-tetraphenyl-5,10-dithia-1,3,7,9-tetraaza-2,8-disila-4,6-digermadispiro[3.1.3.1]decane acetonitrile monosolvate |
| Authors of publication |
Guo, Wenzhen; Ma, Fengle; Zheng, Wenjun |
| Journal of publication |
IUCrData |
| Year of publication |
2016 |
| Journal volume |
1 |
| Journal issue |
2 |
| Pages of publication |
x160299 |
| a |
11.0447 ± 0.0005 Å |
| b |
13.4587 ± 0.0006 Å |
| c |
13.9291 ± 0.0006 Å |
| α |
64.297 ± 0.004° |
| β |
82.371 ± 0.004° |
| γ |
85.629 ± 0.004° |
| Cell volume |
1848.74 ± 0.16 Å3 |
| Cell temperature |
153 ± 2 K |
| Ambient diffraction temperature |
153 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0678 |
| Residual factor for significantly intense reflections |
0.046 |
| Weighted residual factors for significantly intense reflections |
0.1238 |
| Weighted residual factors for all reflections included in the refinement |
0.1375 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.075 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/1542756.html
