Information card for entry 1543575
| Chemical name |
5,7,7,12,14,14-Hexamethyl-4,11-diaza-1,8-diazoniacyclotetradeca-4,11-diene bis(methanesulfonate) |
| Formula |
C18 H40 N4 O6 S2 |
| Calculated formula |
C18 H40 N4 O6 S2 |
| SMILES |
S(=O)(=O)([O-])C.S(=O)(=O)([O-])C.[NH2+]1CCN=C(C)CC([NH2+]CCN=C(C)CC1(C)C)(C)C |
| Title of publication |
5,7,7,12,14,14-Hexamethyl-4,11-diaza-1,8-diazoniacyclotetradeca-4,11-diene bis(methanesulfonate) |
| Authors of publication |
Spendel, Katherine; Nazarenko, Alexander Y. |
| Journal of publication |
IUCrData |
| Year of publication |
2016 |
| Journal volume |
1 |
| Journal issue |
6 |
| Pages of publication |
x161033 |
| a |
9.7931 ± 0.0012 Å |
| b |
8.6816 ± 0.0011 Å |
| c |
14.1098 ± 0.0017 Å |
| α |
90° |
| β |
94.003 ± 0.004° |
| γ |
90° |
| Cell volume |
1196.7 ± 0.3 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0627 |
| Residual factor for significantly intense reflections |
0.0408 |
| Weighted residual factors for significantly intense reflections |
0.0999 |
| Weighted residual factors for all reflections included in the refinement |
0.1102 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.048 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/1543575.html