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Information card for entry 1546438
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| Coordinates | 1546438.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | ;Dy2S@C3v(8)-C82/Ni(OEP)/2(C7H8); |
|---|---|
| Chemical name | Dy2S@C3v(8)-C82/Ni(OEP)/2(C7H8) |
| Formula | C132 H60 Dy2 N4 Ni S |
| Calculated formula | C132 H60 Dy2 N4 Ni S0.999 |
| Title of publication | Selective arc-discharge synthesis of Dy2S-clusterfullerenes and their isomer-dependent single molecule magnetism |
| Authors of publication | Chen, Chia-Hsiang; Krylov, Denis; Avdoshenko, Stanislav; Liu, Fupin; Spree, Lukas; Yadav, Ravi; Alvertis, Antonis; Hozoi, Liviu; Nenkov, Konstantin; Kostanyan, Aram; Greber, Thomas; Wolter, A.; Popov, Alexey A. |
| Journal of publication | Chem. Sci. |
| Year of publication | 2017 |
| a | 25.25 ± 0.005 Å |
| b | 14.86 ± 0.003 Å |
| c | 20.46 ± 0.004 Å |
| α | 90° |
| β | 97.74 ± 0.03° |
| γ | 90° |
| Cell volume | 7607 ± 3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.234 |
| Residual factor for significantly intense reflections | 0.163 |
| Weighted residual factors for significantly intense reflections | 0.4063 |
| Weighted residual factors for all reflections included in the refinement | 0.4406 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
| Diffraction radiation wavelength | 0.89429 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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