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Information card for entry 1547410
Preview
| Coordinates | 1547410.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Sulfamerazine |
|---|---|
| Chemical name | 4-amino-N-(4-methylpyrimidin-2-yl) |
| Formula | C11 H12 N4 O2 S |
| Calculated formula | C8 H8.72727 N2.90909 O1.45455 S0.727273 |
| SMILES | S(=O)(=O)(Nc1nc(ccn1)C)c1ccc(N)cc1 |
| Title of publication | Sulfamerazine: Understanding the Influence of Slip Planes in the Polymorphic Phase Transformation through X-Ray Crystallographic Studies and ab Initio Lattice Dynamics |
| Authors of publication | Anuradha R. Pallipurath; Jonathan M. Skelton; Mark R. Warren; Naghmeh Kamali; Patrick McArdle; Andrea Erxleben |
| Journal of publication | Molecular Pharmaceutics |
| Year of publication | 2015 |
| Journal volume | 12 |
| Pages of publication | 3735 - 3748 |
| a | 14.4829 ± 0.0006 Å |
| b | 8.1938 ± 0.0003 Å |
| c | 21.8441 ± 0.0009 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2592.24 ± 0.18 Å3 |
| Cell temperature | 200 ± 0.1 K |
| Ambient diffraction temperature | 200 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0697 |
| Residual factor for significantly intense reflections | 0.0456 |
| Weighted residual factors for significantly intense reflections | 0.0789 |
| Weighted residual factors for all reflections included in the refinement | 0.09 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.976 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1547410.html
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structural data.