Information card for entry 1548215

Structure parameters

• Formula: C72 H104 Al2 N10 Te2
• Calculated formula: C72 H104 Al2 N10 Te2
• SMILES: [Te]1[Al]([Te][Al]1(N=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)=C1N(C(=C(N1CC)C)C)CC)(N=C1N(C=CN1c1c(C(C)C)cccc1C(C)C)c1c(cccc1C(C)C)C(C)C)=C1N(C(=C(N1CC)C)C)CC
• Title of publication: A monotopic aluminum telluride with an Al=Te double bond stabilized by N-heterocyclic carbenes
• Authors of publication: Franz, Daniel; Szilvasi, Tibor; Irran, Elisabeth; Inoue, Shigeyoshi
• Journal of publication: Nature Communications
• Year of publication: 2015
• Journal volume: 6
• Pages of publication: 10037
• a: 10.4285 ± 0.0006 Å
• b: 12.9619 ± 0.0008 Å
• c: 15.2266 ± 0.0007 Å
• α: 107.012 ± 0.005°
• β: 101.576 ± 0.005°
• γ: 104.722 ± 0.005°
• Cell volume: 1817.4 ± 0.2 ų
• Cell temperature: 150 ± 0.1 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0658
• Residual factor for significantly intense reflections: 0.0584
• Weighted residual factors for significantly intense reflections: 0.1504
• Weighted residual factors for all reflections included in the refinement: 0.1618
• Goodness-of-fit parameter for all reflections included in the refinement: 1.084
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No