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Information card for entry 1549260
Preview
| Coordinates | 1549260.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H30 N2 Pb Si2 |
|---|---|
| Calculated formula | C15 H30 N2 Pb Si2 |
| SMILES | [Pb]1(c2ccccc2C[N]1(C)C)N([Si](C)(C)C)[Si](C)(C)C |
| Title of publication | Stable lead(ii) boroxides. |
| Authors of publication | Someşan, Adrian-Alexandru; Le Coz, Erwann; Roisnel, Thierry; Silvestru, Cristian; Sarazin, Yann |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2018 |
| Journal volume | 54 |
| Journal issue | 42 |
| Pages of publication | 5299 - 5302 |
| a | 8.9054 ± 0.001 Å |
| b | 10.6022 ± 0.0011 Å |
| c | 12.4223 ± 0.0014 Å |
| α | 103.574 ± 0.004° |
| β | 110.985 ± 0.004° |
| γ | 103.843 ± 0.004° |
| Cell volume | 994.7 ± 0.2 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0264 |
| Residual factor for significantly intense reflections | 0.024 |
| Weighted residual factors for significantly intense reflections | 0.0624 |
| Weighted residual factors for all reflections included in the refinement | 0.0632 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.159 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1549260.html
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Users of the data should acknowledge the original authors of the
structural data.