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Information card for entry 1549598
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| Coordinates | 1549598.cif |
|---|---|
| Original IUCr paper | HTML |
| Common name | Mullite |
|---|---|
| Formula | Al4.857 O9.571 Si1.143 |
| Calculated formula | Al4.856 O9.57 Si1.144 |
| Title of publication | Exploiting superspace to clarify vacancy and Al/Si ordering in mullite |
| Authors of publication | Klar, Paul Benjamin; Etxebarria, Iñigo; Madariaga, Gotzon |
| Journal of publication | IUCrJ |
| Year of publication | 2018 |
| Journal volume | 5 |
| Journal issue | 4 |
| a | 7.5787 ± 0.0007 Å |
| b | 7.6707 ± 0.0004 Å |
| c | 2.8836 ± 0.0001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 167.635 ± 0.019 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 55 |
| Hermann-Mauguin space group symbol | P b a m |
| Hall space group symbol | -P 2 2ab |
| Residual factor for all reflections | 0.0384 |
| Residual factor for significantly intense reflections | 0.0371 |
| Weighted residual factors for significantly intense reflections | 0.1028 |
| Weighted residual factors for all reflections included in the refinement | 0.1044 |
| Goodness-of-fit parameter for significantly intense reflections | 1.12 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.01 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7231 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1549598.html
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Users of the data should acknowledge the original authors of the
structural data.