Information card for entry 1549661
| Formula |
C20 H26 N2 O4 S |
| Calculated formula |
C20 H26 N2 O4 S |
| SMILES |
c1cccc2c1nc(c(n2)C)SC[C@H]1OC(O[C@@H]1[C@@H]1COC(O1)(C)C)(C)C.c1cccc2c1nc(c(n2)C)SC[C@@H]1OC(O[C@H]1[C@H]1COC(O1)(C)C)(C)C |
| Title of publication |
Crystal Structure of 2-S-(1′-Deoxy-2′,3′:4′,5′-di-O-isopropylidene-D,L-xylit-1′-ylthio)-3-methylquinoxaline |
| Authors of publication |
Mondieig, D.; Négrier, Ph.; Léger, J. M.; Massip, S.; Benali, B.; Jermoumi, C.; Lakhrissi, B. |
| Journal of publication |
X-ray Structure Analysis Online |
| Year of publication |
2010 |
| Journal volume |
26 |
| Pages of publication |
1 |
| a |
14.59 ± 0.003 Å |
| b |
9.6772 ± 0.0019 Å |
| c |
28.074 ± 0.005 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
3963.8 ± 1.3 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
33 |
| Hermann-Mauguin space group symbol |
P n a 21 |
| Hall space group symbol |
P 2c -2n |
| Residual factor for all reflections |
0.0565 |
| Residual factor for significantly intense reflections |
0.051 |
| Weighted residual factors for significantly intense reflections |
0.1514 |
| Weighted residual factors for all reflections included in the refinement |
0.1654 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.023 |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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