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Information card for entry 1550029
Preview
| Coordinates | 1550029.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H22 N2 O |
|---|---|
| Calculated formula | C14 H22 N2 O |
| SMILES | O=C(Nc1c(cccc1)C)N(C(C)C)C(C)C |
| Title of publication | A new family of urea-based low molecular-weight organogelators for environmental remediation: the influence of structure. |
| Authors of publication | Peveler, William J.; Packman, Hollie; Alexander, Shirin; Chauhan, Raamanand R.; Hayes, Lilian M.; Macdonald, Thomas J.; Cockcroft, Jeremy K.; Rogers, Sarah; Aarts, Dirk G. A. L.; Carmalt, Claire J.; Parkin, Ivan P.; Bear, Joseph C. |
| Journal of publication | Soft matter |
| Year of publication | 2018 |
| Journal volume | 14 |
| Journal issue | 43 |
| Pages of publication | 8821 - 8827 |
| a | 23.0581 ± 0.0013 Å |
| b | 16.6608 ± 0.0012 Å |
| c | 15.1185 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5808 ± 0.7 Å3 |
| Cell temperature | 295 K |
| Ambient diffraction temperature | 295 K |
| Number of distinct elements | 4 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.2145 |
| Residual factor for significantly intense reflections | 0.168 |
| Weighted residual factors for significantly intense reflections | 0.415 |
| Weighted residual factors for all reflections included in the refinement | 0.4677 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.631 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1550029.html
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Users of the data should acknowledge the original authors of the
structural data.