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Information card for entry 1550316
Preview
| Coordinates | 1550316.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C276 H200 Ag44 F30 P4 S30 |
|---|---|
| Calculated formula | C276 H200 Ag44 F30 P4 S30 |
| Title of publication | 3D to 2D reorganization of silver-thiol nanostructures, triggered by solvent vapor annealing. |
| Authors of publication | Dell'Elce, Simone; Liscio, Fabiola; Kovtun, Alessandro; Allegri, Stefano; Roscioni, Otello M.; Albonetti, Cristiano; De Luca, Giovanna; Amenitsch, Heinz W.; Demitri, Nicola; Giorgini, Loris; Morandi, Vittorio; Stellacci, Francesco; Liscio, Andrea; Palermo, Vincenzo |
| Journal of publication | Nanoscale |
| Year of publication | 2018 |
| Journal volume | 10 |
| Journal issue | 48 |
| Pages of publication | 23018 - 23026 |
| a | 20.4051 ± 0.0004 Å |
| b | 20.8665 ± 0.0004 Å |
| c | 21.9791 ± 0.0004 Å |
| α | 114.956 ± 0.002° |
| β | 93.756 ± 0.002° |
| γ | 116.423 ± 0.002° |
| Cell volume | 7219.1 ± 0.4 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.088 |
| Residual factor for significantly intense reflections | 0.0585 |
| Weighted residual factors for significantly intense reflections | 0.1333 |
| Weighted residual factors for all reflections included in the refinement | 0.1459 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation wavelength | 0.70848 Å |
| Diffraction radiation type | Synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1550316.html
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Users of the data should acknowledge the original authors of the
structural data.