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Information card for entry 1550375
Preview
| Coordinates | 1550375.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C77 H51.5 Cl6 S5 |
|---|---|
| Calculated formula | C77 H51.5 Cl6 S5 |
| SMILES | ClC(Cl)Cl.ClC(Cl)Cl.s1c(c2c(c3c4c5c6c7c8c5c(cc(c8cc(c7cc(c6c3)c3ccccc3c3sc(cc3)C)c3ccccc3c3sc(cc3)C)c3ccccc3c3sc(cc3)C)c(c4)c3ccccc3c3sc(cc3)C)cccc2)ccc1C |
| Title of publication | Synthesis and Structural Features of Thiophene-fused Analogues of Warped Nanographene and Quintuple Helicene |
| Authors of publication | Lin, Hsing-An; Kato, Kenta; Segawa, Yasutomo; Scott, Lawrence T.; Itami, Kenichiro |
| Journal of publication | Chemical Science |
| Year of publication | 2019 |
| a | 21.7713 ± 0.0006 Å |
| b | 21.459 ± 0.0006 Å |
| c | 27.4874 ± 0.0007 Å |
| α | 90° |
| β | 92.893 ± 0.003° |
| γ | 90° |
| Cell volume | 12825.5 ± 0.6 Å3 |
| Cell temperature | 123 K |
| Ambient diffraction temperature | 123 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1146 |
| Residual factor for significantly intense reflections | 0.0899 |
| Weighted residual factors for significantly intense reflections | 0.2491 |
| Weighted residual factors for all reflections included in the refinement | 0.2702 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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