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Information card for entry 1550510
Preview
| Coordinates | 1550510.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H42 Si Zr |
|---|---|
| Calculated formula | C36 H42 Si Zr |
| SMILES | [c]123[c]4([c]5([c]67[c]1(c(c(c(c6C)C)C)C)[Zr]16893457([c]3([cH]1[cH]6[cH]8[cH]93)[Si]2(C)C)(Cc1ccccc1)Cc1ccccc1)C)C |
| Title of publication | Group 4 permethylindenyl complexes for slurry-phase polymerisation of ethylene |
| Authors of publication | Lamb, Jessica V.; Buffet, Jean-Charles; Turner, Zoë R.; O'Hare, Dermot |
| Journal of publication | Polymer Chemistry |
| Year of publication | 2019 |
| Journal volume | 10 |
| Journal issue | 11 |
| Pages of publication | 1386 |
| a | 12.4776 ± 0.0006 Å |
| b | 14.8663 ± 0.0012 Å |
| c | 17.9117 ± 0.0005 Å |
| α | 100.463 ± 0.005° |
| β | 101.218 ± 0.004° |
| γ | 105.208 ± 0.006° |
| Cell volume | 3048.5 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 149.9 ± 0.3 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1746 |
| Residual factor for significantly intense reflections | 0.1518 |
| Weighted residual factors for significantly intense reflections | 0.3524 |
| Weighted residual factors for all reflections included in the refinement | 0.3705 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.484 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1550510.html
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Users of the data should acknowledge the original authors of the
structural data.