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Information card for entry 1550711
Preview
| Coordinates | 1550711.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C206.75 H280 N42 O42.75 Rb Si8 |
|---|---|
| Calculated formula | C206.75 H280 N42 O42.75 Rb Si8 |
| SMILES | [Rb]([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N)([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N)([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N)([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N)([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N)([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N)([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N)([O]=c1[nH]c(nc2n(c(nc12)c1ccccc1)[C@@H]1O[C@@H]([C@H]2OC(O[C@@H]12)(C)C)CO[Si](C)(C)C(C)(C)C)N).OC.OC.OC.N#CC.N#CC |
| Title of publication | Construction of cross-layer linked G-octamer via conformational control: stable G-quadruplex in H-bond competitive solvent |
| Authors of publication | Shi, Xiaodong; He, Ying; Zhang, Yanbin; Wojtas, Lukasz; Ahkmedov, Novruz G.; Thai, David; Wang, Heng; Li, Xiaopeng; Guo, Hao |
| Journal of publication | Chemical Science |
| Year of publication | 2019 |
| a | 43.381 ± 0.009 Å |
| b | 43.722 ± 0.009 Å |
| c | 14.181 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 26897 ± 10 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 18 |
| Hermann-Mauguin space group symbol | P 21 21 2 |
| Hall space group symbol | P 2 2ab |
| Residual factor for all reflections | 0.1701 |
| Residual factor for significantly intense reflections | 0.1474 |
| Weighted residual factors for significantly intense reflections | 0.3511 |
| Weighted residual factors for all reflections included in the refinement | 0.3615 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.384 |
| Diffraction radiation wavelength | 0.41328 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1550711.html
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Users of the data should acknowledge the original authors of the
structural data.