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Information card for entry 1551763
Preview
| Coordinates | 1551763.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H75 Cl4 N2 O0.5 P3 Pt3 Se2 |
|---|---|
| Calculated formula | C31 H75 Cl4 N2 O0.5 P3 Pt3 Se2 |
| SMILES | C(CC)[P](CCC)(CCC)[Pt]1([NH2]CC[Se]1[Pt]1([NH2]CC[Se]1[Pt]([P](CCC)(CCC)CCC)(Cl)Cl)[P](CCC)(CCC)CCC)Cl.[Cl-].O |
| Title of publication | Crystal Structure of [Pt3Cl3(μ-SeCH2CH2NH2)2(PPr3)3]Cl |
| Authors of publication | KUMBHARE, Liladhar B.; WADAWALE, Amey; JAIN, Vimal K. |
| Journal of publication | X-ray Structure Analysis Online |
| Year of publication | 2010 |
| Journal volume | 26 |
| Pages of publication | 69 |
| a | 10.969 ± 0.003 Å |
| b | 15.39 ± 0.005 Å |
| c | 18.197 ± 0.003 Å |
| α | 68.46 ± 0.017° |
| β | 82.365 ± 0.017° |
| γ | 70.17 ± 0.02° |
| Cell volume | 2687.8 ± 1.3 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.127 |
| Residual factor for significantly intense reflections | 0.059 |
| Weighted residual factors for significantly intense reflections | 0.1648 |
| Weighted residual factors for all reflections included in the refinement | 0.1845 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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