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Information card for entry 1551818
Preview
| Coordinates | 1551818.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Er3N@Ih-C80 Ni(OEP) |
|---|---|
| Chemical name | Er3N@Ih-C80 Ni(OEP) |
| Formula | C128 H56 Er3 N5 Ni S0 |
| Calculated formula | C128 H56 Er3 N5 Ni |
| Title of publication | Crystallographic characterization of Er<sub>3</sub>N@C<sub>2n</sub> (2n = 80, 82, 84, 88): the importance of a planar Er<sub>3</sub>N cluster. |
| Authors of publication | Hu, Shuaifeng; Zhao, Pei; Shen, Wangqiang; Yu, Pengyuan; Huang, Wenhuan; Ehara, Masahiro; Xie, Yunpeng; Akasaka, Takeshi; Lu, Xing |
| Journal of publication | Nanoscale |
| Year of publication | 2019 |
| Journal volume | 11 |
| Journal issue | 28 |
| Pages of publication | 13415 - 13422 |
| a | 25.302 ± 0.003 Å |
| b | 15.15 ± 0.002 Å |
| c | 19.79 ± 0.003 Å |
| α | 90° |
| β | 95.315 ± 0.003° |
| γ | 90° |
| Cell volume | 7553.4 ± 1.8 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0488 |
| Residual factor for significantly intense reflections | 0.0385 |
| Weighted residual factors for significantly intense reflections | 0.0882 |
| Weighted residual factors for all reflections included in the refinement | 0.0971 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.089 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1551818.html
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structural data.